Cathodoluminescence of TiO2 Films Formed by Molecular Layer Deposition von Baraban, A. P., Selivanov, A. A., Dmitriev, V. A., Drozd, A. V., Drozd, V. E.

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Transparent-conductive-oxide (TCO) buffer layer effect on the resistive switching process in metal TiO2 TCO metal assemblies von Filatova, E O, Baraban, A P, Konashuk, A S, Konyushenko, M A, Selivanov, A A, Sokolov, A A, Schaefers, F, Drozd, V E

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Features of SiO2 Layers Synthesized on Silicon by Molecular Layer Deposition von Baraban, A. P., Denisov, E. A., Dmitriev, V. A., Drozd, A. V., Drozd, V. E., Selivanov, A. A., Seisyan, R. P.

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Interface properties of Si-SiO2-Ta2O5 structure by cathodoluminescence spectroscopy von Baraban, A. P., Dmitriev, V. A., Drozd, V. E., Prokofiev, V. A., Samarin, S. N., Filatova, E. O.

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Electroluminescence of Ta2O5 Films Formed by Molecular Layer Deposition von Baraban, A. P., Dmitriev, V. A., Drozd, V. E., Petrov, Yu. V., Prokof’ev, V. A.

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Structure, optical properties and visible-light-induced photochemical activity of nanocrystalline ZnO films deposited by atomic layer deposition onto Si(100) von Drozd, V.E., Titov, V.V., Kasatkin, I.A., Basov, L.L., Lisachenko, A.A., Stroyuk, O.L., Kuchmiy, S.Y.

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ALD synthesis of SnSe layers and nanostructures von Drozd, V E, Nikiforova, I O, Bogevolnov, V B, Yafyasov, A M, Filatova, E O, Papazoglou, D

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Ultrasoft x-ray reflection and emission spectroscopic analysis of Al2O3/Si structure synthesized by the atomic layer deposition method von Filatova, E. O., Taracheva, E. Yu, Sokolov, A. A., Bukin, S. V., Shulakov, A. S., Jonnard, P., André, J.-M., Drozd, V. E.

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Properties of an Al2O3/Si interface von Shulakov, A S, Braiko, A P, Bukin, S V, Drozd, V E

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Features of SiO.sub.2 Layers Synthesized on Silicon by Molecular Layer Deposition von Baraban, A. P, Denisov, E. A, Dmitriev, V. A, Drozd, A. V, Drozd, V. E, Selivanov, A. A, Seisyan, R. P

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Study of the Myb114 Gene Polymorphism in the Cole Crops (Brassica oleracea L.) in Connection with Anthocyanin Biosynthesis Regulation Based on Comparison with the MYB Factors of Ve... von Fateev, D. A., Berensen, F. A., Artemyeva, A. M., Babak, O. G., Yatsevich, K. K., Drozd, E. V., Kilchevsky, A. V.

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Study of Al2O3 nanolayers synthesized onto porous SiO2 using X-ray reflection spectroscopy von Konashuk, A.S., Sokolov, A.A., Drozd, V.E., Schaefers, F., Filatova, E.O.

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Interface properties of Si-SiO{sub 2}-Ta{sub 2}O{sub 5} structure by cathodoluminescence spectroscopy von Baraban, A. P., Dmitriev, V. A., Drozd, V. E., Prokofiev, V. A., Filatova, E. O., Samarin, S. N., School of Physics, The University of Western Australia, Perth, Western Australia 6009

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Photoluminescence of Ta2O5 films formed by the molecular layer deposition method von Baraban, A. P., Dmitriev, V. A., Prokof’ev, V. A., Drozd, V. E., Filatova, E. O.

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Transparent-conductive-oxide (TCO) buffer layer effect on the resistive switching process in metal/TiO 2 /TCO/metal assemblies von Filatova, E O, Baraban, A P, Konashuk, A S, Konyushenko, M A, Selivanov, A A, Sokolov, A A, Schaefers, F, Drozd, V E

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Transparent-conductive-oxide (TCO) buffer layer effect on the resistive switching process in metal/TiO sub(2)/TCO/metal assemblies von Filatova, E O, Baraban, A P, Konashuk, A S, Konyushenko, M A, Selivanov, A A, Sokolov, A A, Schaefers, F, Drozd, V E

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X-ray spectral analysis of the interface of a thin Al2O3 film prepared on silicon by atomic layer deposition von Shulakov, A. S., Braiko, A. P., Bukin, S. V., Drozd, V. E.

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Synthesis of conducting oxides by ML-ALE von Drozd, V.E., Aleskovski, V.B.

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Exciton Photoluminescence of ZnO Thin Films Grown by ALD-Technique von Labzowskaya, M.E., Akopyan, I.Kh, Novikov, B.V., Serov, A.E., Filosofov, N.G., Basov, L.L., Drozd, V.E., Lisachenko, A.A.

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The influence of porous silica substrate on the properties of alumina films studied by X-ray reflection spectroscopy von Konashuk, A. S., Sokolov, A. A., Drozd, V. E., Romanov, A. A., Filatova, E. O.

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