Investigation of position detectors for atomic force microscopes von Vorbringer-Dorozhovets, Nataliya, Mastylo, Rostyslav, Manske, Eberhard

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Tactile 3D microprobe system with exchangeable styli von Balzer, Felix G, Hausotte, Tino, Dorozhovets, Nataliya, Manske, Eberhard, Jäger, Gerd

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Dimensional metrology in the macroscopic range with sub-nanometre resolution von Hausotte, Tino, Vorbringer-Dorozhovets, Nataliya, Shen, Jing C, Manske, Eberhard, Jäger, Gerd

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Navigation in a Large Measurement Volume by Using AFM Technology as a Sensor System in the NPMMNavigation in einem großen Messvolumen in der Nanopositionier- und Mess-Maschine (NPM... von Machleidt, Torsten, Sparrer, Erik, Dorozhovets, Nataliya, Manske, Eberhard, Franke, Karl-Heinz, Kapusi, Daniel

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Nanotopographic characterization of spotted micro arrays on polyvinyl alcohol films by high-resolution long-range nanoprofiling von Thete, Aniket R., Gross, G. Alexander, Hausotte, Tino, Jäger, Gerd, Dorozhovets, Nataliya, Köhler, J. Michael

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Application of the metrological SPM for long distance measurements von Vorbringer-Dorozhovets, Nataliya, Providers Dorozhovets, Nataliya

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Markers for referencing topography measurement data of optical surfaces

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Metrologisches Rasterkraftmikroskop von Dorozhovets, Nataliya, Hausotte, Tino, Manske, Eberhard, Jäger, Gerd

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Ongoing trends in precision metrology

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Dimensional metrology in the macroscopic range with sub-nanometre resolution

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