Treffer 1 - 13 von 13 für Suche 'Dokulilová Silvie', Suchdauer: 0,52s Treffer weiter einschränken
  1. 1
    A scintillation detection unit for detecting backscattered electrons for electron or ion microscopes

    A scintillation detection unit for detecting backscattered electrons for electron or ion microscopes von Zadražil Martin, Blažek Karel, Dokulilová Silvie, Horodyský Petr

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  2. 2
    THE SCINTILLATION DETECTION UNIT FOR THE DETECTION OF BACK-SCATTERED ELECTRONS FOR ELECTRON OR ION MICROSCOPES

    THE SCINTILLATION DETECTION UNIT FOR THE DETECTION OF BACK-SCATTERED ELECTRONS FOR ELECTRON OR ION MICROSCOPES von ZADRAZIL MARTIN, HORODYSKY PETR, BLAZEK KAREL, DOKULILOVA SILVIE

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  3. 3
    SCINTILLATION DETECTION UNIT FOR THE DETECTION OF BACK- SCATTERED ELECTRONS ELECTRON OR ION MICROSCOPES

    SCINTILLATION DETECTION UNIT FOR THE DETECTION OF BACK- SCATTERED ELECTRONS ELECTRON OR ION MICROSCOPES von HORODYSKY, PETR, BLAZEK, KAREL, ZADRAZIL, MARTIN, DOKULILOVA, SILVIE

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  4. 4
    SCINTILLATION DETECTION UNIT FOR THE DETECTION OF BACK- SCATTERED ELECTRONS ELECTRON OR ION MICROSCOPES

    SCINTILLATION DETECTION UNIT FOR THE DETECTION OF BACK- SCATTERED ELECTRONS ELECTRON OR ION MICROSCOPES von HORODYSKY, PETR, BLAZEK, KAREL, ZADRAZIL, MARTIN, DOKULILOVA, SILVIE

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  5. 5
    Szintillations-Detektionseinheit zur Detektion rückgestreuter Elektronen für Elektronen- oder Ionenmikroskope

    Szintillations-Detektionseinheit zur Detektion rückgestreuter Elektronen für Elektronen- oder Ionenmikroskope von Zadrazil, Martin, Horodysky, Petr, Dokulilova, Silvie, Blazek, Karel

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  6. 6
    METHOD AND APPARATUS FOR MATERIAL ANALYSIS BY A FOCUSED ELECTRON BEAM USING CHARACTERISTIC X-RAYS AND BACK-SCATTERED ELECTRONS

    METHOD AND APPARATUS FOR MATERIAL ANALYSIS BY A FOCUSED ELECTRON BEAM USING CHARACTERISTIC X-RAYS AND BACK-SCATTERED ELECTRONS von MOTL DAVID, DOKULILOVA SILVIE, FILIP VOJTECH

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  7. 7
    Scintillation detection unit for the detection of back-scattered electrons for electron or ion microscopes

    Scintillation detection unit for the detection of back-scattered electrons for electron or ion microscopes von HORODYSKÝ PETR, ZADRA{HACEK OVER (Z)}IL MARTIN, DOKULILOVA SILVIE, BLA{HACEK OVER (Z)}EK KAREL

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  8. 8
    Method of analyzing material by a focused electron beam by making use of characteristic X-ray radiation and knocked-on electrons and apparatus for making the same

    Method of analyzing material by a focused electron beam by making use of characteristic X-ray radiation and knocked-on electrons and apparatus for making the same von MOTL DAVID, DOKULILOVA SILVIE, FILIP VOJTECH

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  9. 9
    Method of analyzing material by a focused electron beam by making use of characteristic X-ray radiation and knocked-on electrons and apparatus for making the same

    Method of analyzing material by a focused electron beam by making use of characteristic X-ray radiation and knocked-on electrons and apparatus for making the same von MOTL DAVID, DOKULILOVA SILVIE, FILIP VOJTECH

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  10. 10
    Szintillations-Detektionseinheit zur Detektion rückgestreuter Elektronen für Elektronen- oder Ionenmikroskope

    Szintillations-Detektionseinheit zur Detektion rückgestreuter Elektronen für Elektronen- oder Ionenmikroskope von HORODYSKY, PETR, BLAZEK, KAREL, ZADRAZIL, MARTIN, DOKULILOVA, SILVIE

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  11. 11
    Scintillation detection unit for detecting reversely diffracted electrons for electron or field ion microscopes

    Scintillation detection unit for detecting reversely diffracted electrons for electron or field ion microscopes von ZADRAZIL MARTIN, HORODYSKY PETR, BLAZEK KAREL, DOKULILOVA SILVIE

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  12. 12
    Optimization method of assembling and setting system for dust removal from the surface of a sample by focused ion beam and for detecting reversely diffracted electrons and system proposed in such a manner

    Optimization method of assembling and setting system for dust removal from the surface of a sample by focused ion beam and for detecting reversely diffracted electrons and system p... von ZADRAZIL MARTIN, HRNCIR TOMAS, TICHOPADEK PETR, LOPOUR FILIP, DOKULILOVA SILVIE

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  13. 13
    Optimization method of assembling and setting system for dust removal from the surface of a sample by focused ion beam and for detecting reversely diffracted electrons and system proposed in such a manner

    Optimization method of assembling and setting system for dust removal from the surface of a sample by focused ion beam and for detecting reversely diffracted electrons and system p... von ZADRAZIL MARTIN, HRNCIR TOMAS, TICHOPADEK PETR, LOPOUR FILIP, DOKULILOVA SILVIE

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