The Advantages of Limiting P1687 to a Restricted Subset von Doege, J., Crouch, A.L.

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Method and apparatus for securing access to an integrated circuit von DOEGE JASON

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METHOD AND APPARATUS FOR SECURING ACCESS TO AN INTEGRATED CIRCUIT von DOEGE JASON

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IEEE P1687: Toward Standardized Access of Embedded Instrumentation von Posse, Ken, Crouch, Al, Rearick, Jeff, Eklow, Bill, Laisne, Mike, Bennetts, Ben, Doege, Jason, Ricchetti, Mike, Cote, J-f

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Method and system for delay defect location when testing digital semiconductor devices von DOEGE JASON, ORGAN DONALD V

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Dynamically reconfigurable precision signal delay test system for automatic test equipment von BURLISON PHILLIP D, DOEGE JASON E

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Dynamically reconfigurable precision signal delay test system for automatic test equipment von Burlison, Phillip D, Doege, Jason E

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Dynamically reconfigurable precision signal delay test system for automatic test equipment von BURLISON PHILLIP D, DOEGE JASON E

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Dynamically reconfigurable precision signal delay test system for automatic test equipment von Burlison, Phillip D, Doege, Jason E

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AC scan path selection for physical debugging von Crouch, A.L., Potter, J.C., Doege, A.

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Dynamically reconfigurable precision signal delay test system for automatic test equipment von Burlison, Phillip D, Doege, Jason E

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Dynamically reconfigurable precision signal delay test system for automatic test equipment von BURLISON PHILLIP D, DOEGE JASON E

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Low-power IC test can be trying von Hawkins, Chris, Doege, Jason, Kuo, George

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Scan based testing of an integrated circuit for compliance with timing specifications von CORLEY, LEE ALLEN, PRESSLY, MATTHEW DONALD, SHEPARD, CLARK GILSON, GILES, GRADY L, MARQUETTE, DANIEL T, CROUCH, ALFRED LARRY, MATEJA, MICHAEL ALAN, DOEGE, JASON E, AMASON, JR., ODIS DALE

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