A new correlation method for improvement in selectivity of bulk trap measurements from capacitance and voltage transients von Dmowski, K.

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Side data analysis of deep level transient spectroscopy spectra for a multipoint correlation method with binomial weighting coefficients von Dmowski, K

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A multipoint correlation method with binomial weighting coefficients for deep-level measurements in metal-oxide-semiconductor devices von DMOWSKI, K

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The influence of quantum effects on the determination of gate oxide thickness from C- V measurements von Dmowski, K., Halimaoui, A.

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Feathers of the magpie (Pica pica) as a bioindicator material for heavy metal pollution assessment von Dmowski, K., Golimowski, J.

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Identification of tunneling emission in Si-SiO2 interfaces by multipoint correlation method with binomial weighting coefficients von Dmowski, K., Jakubowski, A.

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A modified method of side data analysis of deep level transient spectroscopy spectra von Dmowski, K., Vuillaume, D., Lepley, B.

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Distribution of elements in flight feathers of a white-tailed eagle von Altmeyer, M., Dittmann, J., Dmowski, K., Wagner, G., Müller, P.

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A method to correct for leakage current effects in deep level transient spectroscopy measurements on Schottky diodes von DMOWSKI, K, LEPLEY, B, LOSSON, E, EL BOUABDELLATI, M

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Determination of Thallium and Other Elements (As, Cd, Cu, Mn, Pb, Se, Sb, and Zn) in Water and Sediment Samples from the Vicinity of the Zinc-Lead Smelter in Poland (3 pp) von Krasnodebska-Ostrega, B, Dmowski, K, Stryjewska, E, Golimowski, J

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Interface state measurements by the DLS‐82E lock‐in spectrometer von Dmowski, K., Vuillaume, D., Lepley, B., Losson, E., Bath, A.

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Current deep‐level transient spectroscopy in MOS structures with a boxcar integrator and an arbitrary gate‐width‐data analysis von Dmowski, K., Bethge, K.

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Electrical properties of MIS structures with BN insulating layer von Dmowski, K., Lepley, B., Bath, A., Losson, E., Thevenin, P., Al Idrissi Nabil, S.

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Peak and side data analyses to measure deep levels by DLS-82E lock-in spectrometer von Dmowski, K., Lepley, B., Losson, E., Bath, A.

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Sensitivity analysis of bulk traps detection in analog deep‐level transient spectroscopy measurement systems with exponentially weighted average von Dmowski, K., Jakubowski, A.

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A numerical procedure to determine near midgap level defect parameters in Schottky diodes with significant leakage current densities von Dmowski, K., Losson, E., Lepley, B.

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Deep‐level transient spectroscopy in MOS structures with a dual‐channel boxcar integrator and arbitrarily chosen gate‐width–data analysis von Dmowski, K., Jakubowski, A.

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A multipoint correlation method for bulk trap and interface state measurements in MOS structures from capacitance, voltage, and current transients von Dmowski, K., Bethge, K., Maurer, Ch

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Theoretical signal‐to‐noise ratio for correlators with linear averaging von Dmowski, K., Pióro, Z.

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Small Mammal Populations and Community under Conditions of Extremely High Thallium Contamination in the Environment von Dmowski, Krzysztof, Kozakiewicz, Anna, Kozakiewicz, Michał

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