Higher order tip effects in traceable CD-AFM-based linewidth measurements von Orji, N G, Dixson, R G

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Three-nucleon charge radius: A precise laser determination using 3He von Shiner, D, Dixson, R, Vedantham, V, V

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Conformal oxides on Si surfaces von Tsai, Vincent, Wang, X.-S., Williams, Ellen D., Schneir, J., Dixson, R.

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Precise measurement of the Lamb shift and fine structure of the 2S-2P transition in triplet helium von Shiner, D, Dixson, R, Zhao, P

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Management approach for recurrent spontaneous pneumothorax in consecutive pregnancies based on clinical and radiographic findings von Sills, Eric Scott, Meinecke, Henry M, Dixson, George R, Johnson, Alan M

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Immunohistochemical localization patterns for vimentin and other intermediate filaments in calcified ovarian fibrothecoma von Sills, Eric Scott, Doan, Terrence B, Mock, R James, Dixson, George R, Rohlfing, Michael B

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Measuring the fine structure constant using helium fine structure von Shiner, D.L., Dixson, R.

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Comparison of Measurement Techniques for Linewidth Metrology on Advanced Photomasks von Smith, S., Tsiamis, A., McCallum, M., Hourd, A.C., Stevenson, J.T.M., Walton, A.J., Dixson, R.G., Allen, R.A., Potzick, J.E., Cresswell, M.W., Orji, N.G.

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Comparison of SEM and HRTEM CD Measurements Extracted From Test Structures Having Feature Linewidths From 40 to 240 nm von Cresswell, M.W., Allen, R.A., Guthrie, W.F., Murabito, C.E., Dixson, R.G., Hunt, A.

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Traceable calibration of critical-dimension atomic force microscope linewidth measurements with nanometer uncertainty von Dixson, R. G., Allen, R. A., Guthrie, W. F., Cresswell, M. W.

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Recent developments in electrical linewidth and overlay metrology for integrated circuit fabrication processes von CRESSWELL, M. W, SNIEGOWSKI, J. J, GHOSHTAGORE, R. N, ALLEN, R. A, GUTHRIE, W. F, GURNELL, A. W, LINHOLM, L. W, DIXSON, R. G, TEAGUE, E. C

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Algorithms for calculating single-atom step heights von Fu, Joseph, Tsai, Vincent, Köning, Rainer, Dixson, Ronald, Vorburger, Theodore

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Line edge roughness metrology using atomic force microscopes von Orji, Ndubuisi G, Vorburger, Theodore V, Fu, Joseph, Dixson, Ronald G, Nguyen, Cattien V, Raja, Jayaraman

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Problems in surface metrology von Vorburger, T.V., Dixson, R.G., Tsai, V., Doi, T., Song, J.F., Renegar, T.B., Fu, J.

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A chopped high intensity muon beam at the Stopped Muon Channel at LAMPF von Ciskowski, D., Ahn, H., Dixson, R., Fei, X., Hughes, V.W., Matthias, B.E., Pillai, C., Woodle, K.

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Traceable pico-meter level step height metrology von Orji, Ndubuisi G., Dixson, Ronald G., Fu, Joseph, Vorburger, Theodore V.

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The role of periodic interferometer errors in the calibration of capacitance displacement sensors for nanometrology applications von Köning, R, Dixson, R, Fu, J, Vorburger, T V

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Comparison of measurement techniques for advanced photomask metrology von Smith, S., Tsiamis, A., McCallum, M., Hourd, A.C., Stevenson, J.T.M., Walton, A., Dixson, R.G., Allen, R.A., Potzick, J.E., Cresswell, M.W., Orji, N.G.

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Study of Test Structures for Use as Reference Materials for Optical Critical Dimension Applications von Allen, R.A., Patrick, H.J., Bishop, M., Germer, T.A., Dixson, R., Guthrie, W.F., Cresswell, W.

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Three-Nucleon Charge Radius: A Precise Laser Determination Using 3 He von Shiner, D., Dixson, R., Vedantham, V.

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