On the microstructure-property relationship of WTi(N) diffusion barriers von Dirks, A.G., Wolters, R.A.M., Nellissen, A.J.M.

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Crystalline and amorphous rare-earth transition metal alloys von Buschow, K.H.J., Brouha, M., Biesterbos, J.W.M., Dirks, A.G.

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The amorphous to crystalline transition in Fe-B metallic glasses and vapor-deposited thin films von Herold, U., Köster, U., Dirks, A.G.

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Magnetic properties and microstructure of CoCr based vertical recording materials prepared by ion beam sputtering von Smits, J.W., Luitjens, S.B., den Broeder, F.J.A., Dirks, A.G.

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The microstructure and magnetic properties of amorphous TbFe(O 2) thin films von Biesterbos, J.W.M., Dirks, A.G., Farla, M.A.J.P., Grundy, P.J.

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Columnar microstructures in magnetron-sputtered refractory metal thin films of tungsten, molybdenum and W-Ti-(N) von Dirks, A.G., Wolters, R.A.M., De Veirman, A.E.M.

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Columnar microstructure in vapor-deposited thin films von Dirks, A.G., Leamy, H.J.

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On the microstructure-property relationship of W Ti (N) diffusion barriers von Dirks, A.G., Wolters, R.A.M., Nellissen, A.J.M.

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Al reflow studies for deep-submicron structures: properties and microstructure von Webster, M.N., Dirks, A.G.

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Stress voiding and electromigration phenomena in aluminum alloys von Kordic, S., Augur, R.A., Dirks, A.G., Wolters, R.A.M.

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Fabrication of submicron single-crystalline and bamboo A1 lines by recrystallization von van den Homberg, M.J.C., Alkemade, P.F.A., Verbruggen, A.H., Dirks, A.G., Hurd, J.L., Radelaar, S.

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Microstructure and magnetism in amorphous rare-earth–transition-metal thin films. I. Microstructure von Leamy, H. J., Dirks, A. G.

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Method of manufacturing semiconductor device with multilayer wiring von A.G. DIRKS, M.A. WEBSTER

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AlSiV and AlSiVPd films as alternatives for AlSiCu interconnect: microstructure and its impact on reliability von Dirks, A.G., Augur, R.A., De Veirman, A.E.M.

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Cross-sectional transmission electron microscopy studies of metallic multilayers von De Veirman, A.E.M., Hakkens, F.J.G., Dirks, A.G.

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Electromigration phenomena in AlSi and AlVSi thin alloy films von Van Engelen, P.P.J, Dirks, A.G

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Ultramicrohardness of aluminum and aluminum alloy thin films von Dirks, A.G., Wierenga, P.E., van den Broek, J.J.

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Microstructure and magnetism in amorphous rare-earth–transition-metal thin films. II. Magnetic anisotropy von Leamy, H. J., Dirks, A. G.

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XRD Characterization of Sputtered Mo and W Thin Films von Vink, T.J., Dirks, A.G., Somers, Marcel A.J., Daams, J.L.C.

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Rapid diffusion of nitrogen and carbon along interphase interfaces in iron-base diffusion couples von Dirks, A.G., Meijering, J.L.

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