Treffer 1 - 3 von 3 für Suche 'Dion, L.F.', Suchdauer: 0,26s Treffer weiter einschränken
  1. 1
    Effects of statistical thin-oxide thickness variations on the time-dependent dielectric breakdown (TDDB) parameters for wafer level reliability

    Effects of statistical thin-oxide thickness variations on the time-dependent dielectric breakdown (TDDB) parameters for wafer level reliability von Keshavarz, A.A., Dion, L.F.


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  2. 2
    Effects of metal thickness variations on IC metal lifetime due to electromigration

    Effects of metal thickness variations on IC metal lifetime due to electromigration von Keshavarz, A.A., Dion, L.F.


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  3. 3
    Use of a gene-targeted phage display random epitope library to map an antigenic determinant on the bluetongue virus outer capsid protein VP5

    Use of a gene-targeted phage display random epitope library to map an antigenic determinant on the bluetongue virus outer capsid protein VP5 von Wang, Lin-Fa, Du Plessis, Dion H., White, John R., Hyatt, Alex D., Eaton, Bryan T.


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