High resolution mapping of strains and rotations using electron backscatter diffraction von Wilkinson, A. J., Meaden, G., Dingley, D. J.

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Microtexture determination by electron back-scatter diffraction von DINGLEY, D. J, RANDLE, V

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Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns von Britton, T.B., Maurice, C., Fortunier, R., Driver, J.H., Day, A.P., Meaden, G., Dingley, D.J., Mingard, K., Wilkinson, A.J.

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Growth and characterization of electrodeposited Cu/Cu-Ni-Co alloy superlattices von Alper, M., Aplin, P.S., Attenborough, K., Dingley, D.J., Hart, R., Lane, S.J., Lashmore, D.S., Schwarzacher, W.

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High-resolution elastic strain measurement from electron backscatter diffraction patterns: New levels of sensitivity von Wilkinson, Angus J., Meaden, Graham, Dingley, David J.

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Orientation Imaging in the Transmission Electron Microscope von Dingley, David J., Wright, Stuart I.

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Advances in HREBSD for Elastic Strain Measurement and its Application to Mechanical Testing von Dingley, D J, Meaden, G M

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Advances in Automatic EBSP Single Orientation Measurements von Kunze, K., Wright, S. I., Adams, B. L., Dingley, D. J.

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Application of backscatter Kikuchi diffraction in the scanning electron microscope to the study of NiS2 von Baba-Kishi, K. Z., Dingley, D. J.

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Surface texture of iron films grown on copper buffer layer von Ando, Y., Dingley, D.J.

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Backscatter Kikuchi diffraction in the SEM for identification of crystallographic point groups von Baba-Kishi, K. Z., Dingley, D. J.

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Quantitative deformation studies using electron back scatter patterns von Wilkinson, A.J., Dingley, D.J.

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Epitaxial growth of iron and vanadium films vacuum-evaporated onto a copper buffer layer von ANDO, Y, DINGLEY, D. J

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Elastic strain tensor measurement using electron backscatter diffraction in the SEM von Dingley, David J., Wilkinson, Angus J., Meaden, Graham, Karamched, Phani S.

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The mechanical properties of the matrix in continuous-fibre 6061 aluminium-alloy metal-matrix composites von DONG SHENG LI, WISNOM, M. R, DINGLEY, D. J

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Textural pattern observed in iron and vanadium films evaporated onto copper (111) surface von ANDO, Y, BOUZAR, H, DINGLEY, D. J

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The distribution of plastic deformation in a metal matrix composite caused by straining transverse to the fibre direction von Wilkinson, A.J., Dingley, D.J.

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A general method for locating the X-ray source point in Kossel diffraction von Biggin, S., Dingley, D. J.

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Structure and magnetism of Nin/Fen multilayers von JENNETT, N. M, DINGLEY, D. J

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Orientation Imaging Microscopy: New Possibilities for Microstructural Investigations Using Automated BKD Analysis von Kunze, Karsten, Adams, Brent L., Dingley, David J., Wright, Stuart I.

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