Noise performance of frequency modulation Kelvin force microscopy von Diesinger, Heinrich, Deresmes, Dominique, Mélin, Thierry

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InGaAs quantum dot chains grown by twofold selective area molecular beam epitaxy von Barbot, Clément, Rondeau-Body, Claire, Coinon, Christophe, Deblock, Yves, Tilmant, Pascal, Vaurette, François, Yarekha, Dmitri, Berthe, Maxime, Thomas, L., Diesinger, Heinrich, Capiod, Pierre, Desplanque, Ludovic, Grandidier, Bruno

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Cross-talk artefacts in Kelvin probe force microscopy imaging: A comprehensive study von Barbet, S., Popoff, M., Diesinger, H., Deresmes, D., Théron, D., Mélin, T.

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InGaAs quantum dot chains grown by twofold selective area molecular beam epitaxy von Barbot, Clément, Rondeau-Body, Claire, Coinon, Christophe, Deblock, Yves, Tilmant, Pascal, Vaurette, François, Yarekha, Dmitri, Berthe, Maxime, Thomas, Louis, Diesinger, Heinrich, Capiod, Pierre, Desplanque, Ludovic, Grandidier, Bruno

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Voltage transient analysis as a generic tool for solar junction characterization von Prakoso, Ari Bimo, Lu, Chenjin, Rusli, Cortecchia, Daniele, Soci, Cesare, Berthe, Maxime, Deresmes, Dominique, Ayachi, Boubakeur, Vilcot, Jean-Pierre, Diesinger, Heinrich

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Traveling wave dielectrophoresis micropump based on the dispersion of a capacitive electrode layer von Marczak, Marcin, Diesinger, Heinrich

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Tunneling mechanism and contact mechanics of colloidal nanoparticle assemblies von Biaye, Moussa, Zbydniewska, Ewa, Mélin, Thierry, Deresmes, Dominique, Copie, Guillaume, Cleri, Fabrizio, Sangeetha, Neralagatta, Decorde, Nicolas, Viallet, Benoit, Grisolia, Jérémie, Ressier, Laurence, Diesinger, Heinrich

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Effect of the quantum confinement on the optical absorption of porous silicon, investigated by a new in-situ method von Diesinger, Heinrich, Bsiesy, Ahmad, Hérino, Roland, Gelloz, Bernard

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Quantitative (artifact-free) surface potential measurements using Kelvin force microscopy von Melin, Thierry, Barbet, Sophie, Diesinger, Heinrich, Theron, Didier, Deresmes, D.

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Frequency dependent rotation and translation of nanowires in liquid environment von Marczak, Marcin, Hourlier, Djamila, Mélin, Thierry, Adamowicz, Leszek, Diesinger, Heinrich

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Electric force microscopy of individually charged semiconductor nanoparticles von Diesinger, H., Mélin, T., Barbet, S., Deresmes, D., Stiévenard, D.

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In situ measurement of the optical absorption coefficient of porous silicon von Diesinger, Heinrich, Bsiesy, Ahmad, Hérino, Roland

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Photocurrent mapping with submicron resolution on the silicon-electrolyte junction by using near-field optics von Diesinger, Heinrich, Bsiesy, Ahmad, Hérino, Roland, Huant, Serge

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Erratum: “Photocurrent mapping with submicron resolution on the silicon-electrolyte junction by using near-field optics” [J. Appl. Phys. 89 , 3328 (2001)] von Diesinger, Heinrich, Bsiesy, Ahmad, Hérino, Roland, Huant, Serge

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MEASUREMENT OF THE SURFACE POTENTIAL OF A MATERIAL von DERESMES, Dominique, DIESINGER, Heinrich, MELIN, Thierry, THERON, Didier, BARBET, Sophie

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Electromagnetic modeling and optimization of photoconductive switches for terahertz generation and photocurrent transient spectroscopy von Diesinger, H., Panahandeh-Fard, M., Baillargeat, D., Soci, C.

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Measurement of the surface potential of a material von MELIN THIERRY, DERESMES DOMINIQUE, BARBET SOPHIE, DIESINGER HEINRICH, THERON DIDIER

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MEASUREMENT OF THE SURFACE POTENTIAL OF A MATERIAL von DERESMES, DOMINIQUE, DIESINGER, HEINRICH, MELIN, THIERRY, THERON, DIDIER, BARBET, SOPHIE

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MEASUREMENT OF THE SURFACE POTENTIAL OF A MATERIAL von MELIN THIERRY, DERESMES DOMINIQUE, BARBET SOPHIE, DIESINGER HEINRICH, THERON DIDIER

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MESURE DU POTENTIEL DE SURFACE D'UN MATERIAU von MELIN THIERRY, DERESMES DOMINIQUE, BARBET SOPHIE, DIESINGER HEINRICH, THERON DIDIER

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