Cross-talk artefacts in Kelvin probe force microscopy imaging: A comprehensive study von Barbet, S., Popoff, M., Diesinger, H., Deresmes, D., Théron, D., Mélin, T.

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Deformation Localization in Molecular Layers Constrained between Self-Assembled Au Nanoparticles von Copie, G, Biaye, M, Diesinger, H, Melin, T, Krzeminski, C, Cleri, F

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Note: Quantitative (artifact-free) surface potential measurements using Kelvin force microscopy von Mélin, T., Barbet, S., Diesinger, H., Théron, D., Deresmes, D.

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Enhancing photocurrent transient spectroscopy by electromagnetic modeling von Diesinger, H., Panahandeh-Fard, M., Wang, Z., Baillargeat, D., Soci, C.

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Charging and discharging processes of carbon nanotubes probed by electrostatic force microscopy von Zdrojek, M., Mélin, T., Diesinger, H., Stiévenard, D., Gebicki, W., Adamowicz, L.

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Kelvin force microscopy at the second cantilever resonance: An out-of-vacuum crosstalk compensation setup von Diesinger, H., Deresmes, D., Nys, J.-P., Mélin, T.

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Probing nanoscale dipole-dipole interactions by electric force microscopy von Mélin, T, Diesinger, H, Deresmes, D, Stiévenard, D

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Dynamic behavior of amplitude detection Kelvin force microscopy in ultrahigh vacuum von Diesinger, H., Deresmes, D., Nys, J.-P., Mélin, T.

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Hysteretic behavior of the charge injection in single silicon nanoparticles von Diesinger, H., Mélin, T., Deresmes, D., Stiévenard, D., Baron, T.

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Charge-injection mechanisms in semiconductor nanoparticles analyzed from force microscopy experiments von Barbet, S., Mélin, T., Diesinger, H., Deresmes, D., Stiévenard, D.

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Comment on "electrostatics of individual single-walled carbon nanotubes investigated by electrostatic force microscopy" von Zdrojek, M, Mélin, T, Diesinger, H, Stiévenard, D, Gebicki, W, Adamowicz, L

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Electric force microscopy of individually charged semiconductor nanoparticles von Diesinger, H., Mélin, T., Barbet, S., Deresmes, D., Stiévenard, D.

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Traveling wave dielectrophoresis micropump based on the dispersion of a capacitive electrode layer von Marczak, Marcin, Diesinger, Heinrich

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Submicron nickel deposition on silicon from an electrolytic solution controlled by near-field optics von Diesinger, H., Bsiesy, A., Hérino, R.

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Electric force microscopy of individually charged nanoparticles on conductors: An analytical model for quantitative charge imaging von Mélin, T., Diesinger, H., Deresmes, D., Stiévenard, D.

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Frequency dependent rotation and translation of nanowires in liquid environment von Marczak, Marcin, Hourlier, Djamila, Mélin, Thierry, Adamowicz, Leszek, Diesinger, Heinrich

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Near‐field optics on silicon–electrolyte junctions von Diesinger, H., Bsiesy, A., Hérino, R., Huant, S.

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Nano-structuring of silicon and porous silicon by photo-etching using near field optics von Diesinger, H., Bsiesy, A., Hérino, R.

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Charging and discharging processes of carbon nanotubes probedby electrostatic force microscopy von Zdrojek, M., Mélin, T., Diesinger, H., Stiévenard, D., Gebicki, W., Adamowicz, L.

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Ultrafast Charge Carrier Dynamics in Organic (opto)Electronic Materials von CHAN, E, SOCI, C, DIESINGER, H, YIN, J

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