Composition Metrology of Ternary Semiconductor Alloys Analyzed by Atom Probe Tomography von Di Russo, E, Moyon, F, Gogneau, N, Largeau, L, Giraud, E, Carlin, J.-F, Grandjean, N, Chauveau, J. M, Hugues, M, Blum, I, Lefebvre, W, Vurpillot, F, Blavette, D, Rigutti, L

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Compositional accuracy of atom probe tomography measurements in GaN: Impact of experimental parameters and multiple evaporation events von Russo, E. Di, Blum, I., Houard, J., Gilbert, M., Da Costa, G., Blavette, D., Rigutti, L.

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A photonic atom probe coupling 3D atomic scale analysis with in situ photoluminescence spectroscopy von Houard, J., Normand, A., Di Russo, E., Bacchi, C., Dalapati, P., Beainy, G., Moldovan, S., Da Costa, G., Delaroche, F., Vaudolon, C., Chauveau, J. M., Hugues, M., Blavette, D., Deconihout, B., Vella, A., Vurpillot, F., Rigutti, L.

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Thermal robustness of magnetic tunnel junctions with perpendicular shape anisotropy von Lequeux, S, Perrissin, N, Grégoire, G, Tillie, L, Chavent, A, Strelkov, N, Vila, L, Buda-Prejbeanu, L. D, Auffret, S, Sousa, R. C, Prejbeanu, I. L, Di Russo, E, Gautier, E, Conlan, A. P, Cooper, D, Dieny, B

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Detecting Dissociation Dynamics of Phosphorus Molecular Ions by Atom Probe Tomography von Di Russo, E, Blum, I, Rivalta, I, Houard, J, Da Costa, G, Vurpillot, F, Blavette, D, Rigutti, L

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Compositional accuracy in atom probe tomography analyses performed on III-N light emitting diodes von Di Russo, E., Cherkashin, N., Korytov, M., Nikolaev, A. E., Sakharov, A. V., Tsatsulnikov, A. F., Bonef, B., Blum, I., Houard, J., Da Costa, G., Blavette, D., Rigutti, L.

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Multi-microscopy nanoscale characterization of the doping profile in a hybrid Mg/Ge-doped tunnel junction von Di Russo, E, Mavel, A, Fan Arcara, V, Damilano, B, Dimkou, I, Vézian, S, Grenier, A, Veillerot, M, Rochat, N, Feuillet, G, Bonef, B, Rigutti, L, Duboz, J-Y, Monroy, E, Cooper, D

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Dissociation of GaN2+ and AlN2+ in APT: Analysis of experimental measurements von Zanuttini, D., Blum, I., di Russo, E., Rigutti, L., Vurpillot, F., Douady, J., Jacquet, E., Anglade, P.-M., Gervais, B.

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Dissociation of GaN 2+ and AlN 2+ in APT: Analysis of experimental measurements von Zanuttini, D, Blum, I, di Russo, E, Rigutti, L, Vurpillot, F, Douady, J, Jacquet, E, Anglade, P-M, Gervais, B

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Statistical nanoscale study of localised radiative transitions in GaN/AlGaN quantum wells and AlGaN epitaxial layers von Rigutti, L, Mancini, L, Lefebvre, W, Houard, J, Hernàndez-Maldonado, D, Di Russo, E, Giraud, E, Butté, R, Carlin, J-F, Grandjean, N, Blavette, D, Vurpillot, F

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Assessing the Composition of Wide Bandgap Compound Semiconductors by Atom Probe Tomography: A Metrological Problem von Rigutti, L., Mancini, L., Di Russo, E., Blum, I., Moyon, F., Lefebvre, W., Blavette, D., Vurpillot, F., Giraud, E., Carlin, J.F., Butté, R., Grandjean, N., Gogneau, N., Largeau, L., Julien, F. H., Tchernycheva, M., Chauveau, J.M., Hugues, M.

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Dissociation of GaN2+ and AlN2+ inAPT: Analysis of experimental measurements von Blum, I, di Russo E, Rigutti, L, Vurpillot, F, Douady, J, Jacquet, E, P-M, Anglade, Gervais, B

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Optical shaping of a nano-scale tip by femtosecond laser assisted field evaporation von Di Russo, E., Houard, J., Langolff, V., Moldovan, S., Rigutti, L., Deconihout, B., Blavette, D., Bogdanowicz, J., Vella, A.

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Three-dimensional atomic-scale investigation of ZnO-MgxZn1−xO m-plane heterostructures von Di Russo, E., Mancini, L., Moyon, F., Moldovan, S., Houard, J., Julien, F. H., Tchernycheva, M., Chauveau, J. M., Hugues, M., Da Costa, G., Blum, I., Lefebvre, W., Blavette, D., Rigutti, L.

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Multi-microscopy nanoscale characterization of the doping profile in a hybrid Mg/Ge-doped tunnel junction von Di Russo, E, Mavel, A, Fan Arcara, V, Damilano, B, Dimkou, Ioanna, Vézian, S, Grenier, A, Veillerot, M, Rochat, N, Feuillet, G, Bonef, B, Rigutti, L, Duboz, J-y, Monroy, E, Cooper, D

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Solubility limit of Ge Dopants in AlGaN: a Chemical and Microstructural Investigation down to the Nanoscale von Bougerol, C, Robin, E, E Di Russo, Bellet-Amalric, E, Grenier, V, Ajay, A, Rigutti, L, Monroy, E

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A Photonic Atom Probe Analysis of the Effect of Extended and Point Defects on the Luminescence of InGaN/GaN Quantum Dots von Dimkou, I, Houard, J, Rochat, N, Dalapati, P, Di Russo, E, Cooper, D, Grenier, A, Monroy, E, Rigutti, L

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Problems with the use of 7000 series alloy plates in transport applications von Abis, S, Di Russo, E

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An evaluation of AA 7012 microstructure by differential scanning calorimetry von Antonione, C., Marino, F., Riontino, G., Abis, S., di Russo, E.

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A Photonic Atom Probe Analysis of the Effect of Extended and Point Defects on the Luminescence of InGaN/GaN Quantum Dots von Dimkou, I, Houard, J, Rochat, N, Dalapati, P, E Di Russo, Cooper, D, Grenier, A, Monroy, E, Rigutti, L

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