Photovoltaic properties of ferroelectric BaTiO3 thin films rf sputter deposited on silicon von Dharmadhikari, Vineet S., Grannemann, W. W.

Volltext

Space-charge-limited conduction in neodymium oxide thin films von Dharmadhikari, Vineet S

Volltext

Characterization of plasma-deposited silicon nitride coating used for integrated circuit encapsulation von Dharmadhikari, Vineet S.

Volltext

Characterisation of thin films of bismuth oxide by X-ray photoelectron spectroscopy von Dharmadhikari, Vineet S., Sainkar, S.R., Badrinarayan, S., Goswami, A.

Volltext

Dielectric properties of electron-beam-evaporated Nd 2O 3 thin films von Dharmadhikari, Vineet S., Goswami, A.

Volltext

Dielectric properties of electron-beam-evaporated Nd2O3 thin films von Dharmadhikari, Vineet S., Goswami, A.

Volltext

DEFECT DETECTION AND RESPONSE von VAEZ-IRAVANI, MEHDI, DHARMADHIKARI, VINEET, ZAPALAC, GEORGE H, ZHAO, GUOHENG, NGAI, SAMUEL S. H, LEVY, ADY

Volltext bestellen

Dielectric and transport properties of thin polycrystalline CdTe films von DHARMADHIKARI, VINEET S.

Volltext

Conduction and dielectric polarization in neodymium fluoride thin films von DHARMADHIKARI, V. S

Volltext

DEFECT DETECTION AND RESPONSE von VAEZ-IRAVANI, MEHDI, DHARMADHIKARI, VINEET, ZAPALAC, GEORGE H, ZHAO, GUOHENG, NGAI, SAMUEL S. H, LEVY, ADY

Volltext bestellen

Photovoltaic properties of ferroelectric BaTiO sub 3 thin films rf sputter-deposited on silicon von Dharmadhikari, Vineet S, Grannemann, W W

Volltext

DEFECT DETECTION AND RESPONSE von VAEZ-IRAVANI, MEHDI, DHARMADHIKARI, VINEET, ZAPALAC, GEORGE H, ZHAO, GUOHENG, NGAI, SAMUEL S. H, LEVY, ADY

Volltext bestellen

Defect detection using time delay lock-in thermography (LIT) and dark field LIT von ZHAO GUOHENG, LEVY ADY, ZAPALAC GEORDIE, DHARMADHIKARI VINEET, VAEZ-IRAVANI MEHDI, NGAI SAMUEL

Volltext bestellen

Defect detection using time delay lock-in thermography (LIT) and dark field LIT von Zhao, Guoheng, Zapalac, Geordie, Ngai, Samuel, Vaez-Iravani, Mehdi, Levy, Ady, Dharmadhikari, Vineet

Volltext bestellen

DEFECT DETECTION USING TIME DELAY LOCK-IN THERMOGRAPHY (LIT) AND DARK FIELD LIT von ZHAO GUOHENG, LEVY ADY, ZAPALAC GEORDIE, DHARMADHIKARI VINEET, VAEZ-IRAVANI MEHDI, NGAI SAMUEL

Volltext bestellen

Thin film resistors and method of trimming von DHARMADHIKARI, VINEET S

Volltext bestellen

Defect Detection and Response von ZHAO GUOHENG, LEVY ADY, NGAI SAMUEL S.H, DHARMADHIKARI VINEET, VAEZ-IRAVANI MEDHI, ZAPALAC, JR. GEORGE H

Volltext bestellen

Defect detection and response von ZHAO GUOHENG, ZAPALAC GEORGE H, LEVY ADY, DHARMADHIKARI VINEET, VAEZ-IRAVANI MEHDI, NGAI SAMUEL S. H

Volltext bestellen

DEFECT DETECTION AND RESPONSE von ZHAO GUOHENG, ZAPALAC GEORGE H, LEVY ADY, DHARMADHIKARI VINEET, VAEZ IRAVANI MEHDI, NGAI SAMUEL S. H

Volltext bestellen

Defect detection and response von ZHAO GUOHENG, ZAPALAC GEORGE H, LEVY ADY, DHARMADHIKARI VINEET, VAEZ-IRAVANI MEHDI, NGAI SAMUEL S. H

Volltext bestellen