X‐Ray Calc 3: improved software for simulation and inverse problem solving for X‐ray reflectivity von Penkov, Oleksiy V., Li, Mingfeng, Mikki, Said, Devizenko, Alexander, Kopylets, Ihor

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Characterization of MoSi Superconducting Single-Photon Detectors in the Magnetic Field von Korneev, Alexander A., Korneeva, Yuliya P., Mikhailov, Mikhail Yu, Pershin, Yuri P., Semenov, Alexander V., Vodolazov, D. Yu, Divochiy, Alexander V., Vakhtomin, Yuri B., Smirnov, Konstantin V., Sivakov, Alexander G., Devizenko, Alexander Yu, Goltsman, Gregory N.

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Self-Healing Phenomenon and Dynamic Hardness of C 60 -Based Nanocomposite Coatings von Penkov, Oleksiy V., Pukha, Volodymyr E., Devizenko, Alexander Yu, Kim, Hae-Jin, Kim, Dae-Eun

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Self-Healing Phenomenon and Dynamic Hardness of C sub(60)-Based Nanocomposite Coatings von Penkov, Oleksiy V, Pukha, Volodymyr E, Devizenko, Alexander Yu, Kim, Hae-Jin, Kim, Dae-Eun

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Toward Zero Micro/Macro-Scale Wear Using Periodic Nano-Layered Coatings von Penkov, Oleksiy V, Devizenko, Alexander Yu, Khadem, Mahdi, Zubarev, Evgeniy N, Kondratenko, Valeriy V, Kim, Dae-Eun

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Self-Healing Phenomenon and Dynamic Hardness of C60-Based Nanocomposite Coatings von Penkov, Oleksiy V, Pukha, Volodymyr E, Devizenko, Alexander Yu, Kim, Hae-Jin, Kim, Dae-Eun

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X-ray Schwarzschild objective for the carbon window (lambda approximately 4.5 nm) von Artyukov, Igor, Bugayev, Yegor, Devizenko, Olexander, Gullikson, Eric, Kondratenko, Valeriy, Vinogradov, Alexander

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X-ray Schwarzschild objective for the carbon window (λ~4.5 nm) von ARTYUKOV, Igor, BUGAYEV, Yegor, DEVIZENKO, Olexander, GULLIKSON, Eric, KONDRATENKO, Valeriy, VINOGRADOV, Alexander

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NbN single-photon detectors with saturated dependence of quantum efficiency von Smirnov, Konstantin, Divochiy, Alexander, Vakhtomin, Yury, Morozov, Pavel, Zolotov, Philipp, Antipov, Andrey, Seleznev, Vitaliy

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X-ray 3D Imaging of Low-Density Laser-Target Materials von Artyukov, Igor, Borisenko, Natalia, Burenkov, Gleb, Eriskin, Alexander, Polikarpov, Maxim, Vinogradov, Alexander

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The state of individual layers and interfaces in multilayer nanostructures [(Co40Fe40B20)34(SiO2)66/ZnO/C]46 von Yurakov, Yury A., Peshkov, Yaroslav A., Ivkov, Sergey A., Kannykin, Sergey V., Sitnikov, Alexander V., Domashevskaya, Evelina P.

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Evolution of the interface microstructure of short-period Cr/Ti multilayers with increase in number of bi-layers von Sarkar, P., Biswas, A., Rai, S., Modi, M.H., Ghorai, Gurupada, Sahoo, Pratap K., Bhattacharyya, D.

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Demonstrating 30-nm spatial resolution of three-multilayer-mirror objective for extreme ultraviolet microscopy: Imaging test by observing lithography mask von Toyoda, Mitsunori, Yamasoe, Kenjiro, Tokimasa, Akifumi, Uchida, Kentaro, Harada, Tetsuo, Terasawa, Tsuneo, Amano, Tsuyoshi, Watanabe, Takeo, Yanagihara, Mihiro, Kinoshita, Hiroo

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