Test set selection for structural faults in analog IC's von Devarayanadurg, G., Soma, M., Goteti, P., Huynh, S.D.

Volltext

Hierarchy based statistical fault simulation of mixed-signal ICs von Devarayanadurg, G., Goteti, P., Soma, M.

Volltext

Hierarchical ATPG for analog circuits and systems von Soma, M., Huynh, S., Zhang, J., Kim, S., Devarayanadurg, G.

Volltext

DFT for embedded charge-pump PLL systems incorporating IEEE 1149.1 von Goteti, P., Devarayanadurg, G., Soma, M.

Volltext bestellen

Efficient test set design for analog and mixed-signal circuits and systems von Sam Huynh, Jinyan Zhang, Seongwon Kim, Devarayanadurg, G., Soma, M.

Volltext

Dynamic test signal design for analog ICs von Devarayanadurg, G., Soma, M.

Volltext

An interconnect model for arbitrary terminations based on scattering parameters von Devarayanadurg, Giri V., Soma, Mani

Volltext