Priming and testing silicon patch-clamp neurochips von Py, Christophe, Denhoff, Michael W., Sabourin, Nicaulas, Weber, John, Shiu, Matthew, Zhao, Ping

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An accurate calculation of spreading resistance von Denhoff, M W

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A measurement of Young's modulus and residual stress in MEMS bridges using a surface profiler von Denhoff, M W

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Disclosing quantitative RT‐PCR raw data during manuscript submission: a call for action von Untergasser, Andreas, Hellemans, Jan, Pfaffl, Michael W., Ruijter, Jan M., Hoff, Maurice J. B., Dragomir, Mihnea P., Adamoski, Douglas, Dias, Sandra Martha Gomes, Reis, Rui Manuel, Ferracin, Manuela, Dias‐Neto, Emmanuel, Marsh, Ian, Kubista, Mikael, Fabbri, Muller, Goel, Ajay, Slabý, Ondřej, Knutsen, Erik, Chen, Baoqing, Negrini, Massimo, Mimori, Koshi, Pichler, Martin, Papatriantafyllou, Maria, Anfossi, Simone, Schmittgen, Thomas D., Huggett, Jim, Bustin, Stephen, Vandesompele, Jo, Calin, George A.

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Broad-spectrum light emission at microscopic breakdown sites in metal-insulator-silicon tunnel diodes von Mihaychuk, J. G., Denhoff, M. W., McAlister, S. P., McKinnon, W. R., Chin, A.

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