Radiation response of floating gate EEPROM memory cells von Snyder, E.S., McWhorter, P.J., Dellin, T.A., Sweetman, J.D.

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Modeling the memory retention characteristics of silicon-nitride-oxide-silicon nonvolatile transistors in a varying thermal environment von McWhorter, P. J., Miller, S. L., Dellin, T. A.

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Effect of temperature on data retention of silicon-oxide-nitride-oxide-semiconductor nonvolatile memory transistors von MILLER, S. L, MCWHORTER, P. J, DELLIN, T. A, ZIMMERMAN, G. T

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Volume, index-of-refraction, and stress changes in electron-irradiated vitreous silica von Dellin, T. A., Tichenor, D. A., Barsis, E. H.

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Photo-Compton currents emitted from a surface von Dellin, Theodore A., MacCallum, Crawford J.

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