Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected Microscopy von Muller, D.A, Kourkoutis, L. Fitting, Murfitt, M, Song, J.H, Hwang, H.Y, Silcox, J, Dellby, N, Krivanek, O.L

Volltext

Progress in ultrahigh energy resolution EELS von Krivanek, O.L., Dellby, N., Hachtel, J.A., Idrobo, J.-C., Hotz, M.T., Plotkin-Swing, B., Bacon, N.J., Bleloch, A.L., Corbin, G.J., Hoffman, M.V., Meyer, C.E., Lovejoy, T.C.

Volltext

Single atom identification by energy dispersive x-ray spectroscopy von Lovejoy, T. C., Ramasse, Q. M., Falke, M., Kaeppel, A., Terborg, R., Zan, R., Dellby, N., Krivanek, O. L.

Volltext

Direct Sub-Angstrom Imaging of a Crystal Lattice von Nellist, P. D., Chisholm, M. F., Dellby, N., Krivanek, O. L., Murfitt, M. F., Szilagyi, Z. S., Lupini, A. R., Borisevich, A., Sides, W. H., Pennycook, S. J.

Volltext

An electron microscope for the aberration-corrected era von Krivanek, O.L., Corbin, G.J., Dellby, N., Elston, B.F., Keyse, R.J., Murfitt, M.F., Own, C.S., Szilagyi, Z.S., Woodruff, J.W.

Volltext

Aberration‐corrected STEM for atomic‐resolution imaging and analysis von KRIVANEK, O.L., LOVEJOY, T.C., DELLBY, N.

Volltext

Multi-Sun EELS: Ultra-High Energy Resolution combined with High Spatial Resolution and High Beam Current von Dellby, N., Krivanek, O.L., Bacon, N.J., Corbin, G.J., Johnson, N., Hayner, R., Hrncrik, P., Plotkin-Swing, B., Taylor, D., Szilaygi, Z.S., Lovejoy, T.C.

Volltext

Spectroscopic imaging of single atoms within a bulk solid von Varela, M, Findlay, S D, Lupini, A R, Christen, H M, Borisevich, A Y, Dellby, N, Krivanek, O L, Nellist, P D, Oxley, M P, Allen, L J, Pennycook, S J

Volltext

Advances in Ultra-High Energy Resolution STEM-EELS von Lovejoy, T.C., Corbin, G.C., Dellby, N., Hoffman, M.V., Krivanek, O.L.

Volltext

Individual heteroatom identification with X-ray spectroscopy von Stroud, R. M., Lovejoy, T. C., Falke, M., Bassim, N. D., Corbin, G. J., Dellby, N., Hrncirik, P., Kaeppel, A., Noack, M., Hahn, W., Rohde, M., Krivanek, O. L.

Volltext

Towards sub-Å electron beams von Krivanek, O.L., Dellby, N., Lupini, A.R.

Volltext

Opportunities and Challenges in Ultra-High Energy Resolution EELS von Krivanek, Ondrej L., Dellby, N., Hoffman, M.V., Lovejoy, T.C.

Volltext

Advances in STEM and EELS: New Operation Modes, Detectors and Software von Bleloch, A.L., Bacon, N.J., Corbin, G.J., Dellby, N., Hoffman, M.V., Hotz, M.T., Hrncirik, P., Johnson, N., Lovejoy, T.C., Meyer, C.E., Mittelberger, A., Plotkin-Swing, B., Skone, G.S., Szilagyi, Z.S., Krivanek, O.L.

Volltext

Ultra-High Vacuum Aberration-Corrected STEM for in-situ studies von Hotz, M.T., Corbin, G.J., Dellby, N., Krivanek, O.L., Mangier, C., Meyer, J.C.

Volltext

Sub-ångstrom resolution using aberration corrected electron optics von Batson, P. E, Dellby, N, Krivanek, O. L

Volltext

Progress in aberration-corrected scanning transmission electron microscopy von Dellby, N, Krivanek, L, Nellist, D, Batson, E, Lupini, R

Volltext

Hydrogen Analysis by Ultra-High Energy Resolution EELS von Cohen, H., Rez, P., Aoki, T., Crozier, P.A., Dellby, N., Dellby, Z., Gur, D., Lovejoy, T.C., March, K., Sarahan, M.C., Wolf, S.G., Krivanek, O.L.

Volltext

Tuning High Order Geometric Aberrations in Quadrupole-Octupole Correctors von Dellby, N., Corbin, G.J., Dellby, Z., Lovejoy, T.C., Szilagyi, Z.S., Chisholm, M.F., Krivanek, O.L.

Volltext

Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy von Nicolosi, Valeria, Pennycook, Stephen J, Szilagyi, Zoltan S, Murfitt, Matthew F, Own, Christopher S, Krivanek, Ondrej L, Chisholm, Matthew F, Dellby, Niklas, Corbin, George J, Oxley, Mark P, Pennycook, Timothy J, Pantelides, Sokrates T

Volltext

Using Nion Swift for Data Collection, Analysis and Display von Meyer, C.E., Dellby, N., Dellby, Z., Lovejoy, T.C., Sarahan, M.C., Skone, G.S., Krivanek, O.L.

Volltext