Use of a fast atom beam in ion microscopy (FABIM) for analysis of poorly conducting materials von Degrève, F., Lang, J. M.

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Oxygen coverage effects in SIMS quantitative analysis using a primary rastered probe von Lang, J. M., Degrève, F.

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Visualization of imbibition in porous media by environmental scanning electron microscopy: application to reservoir rocks von Combes, R, Robin, M, Blavier, G, Aı̈dan, M, Degrève, F

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A new method of spectra acquisition and exact mass determination of resolved peaks in high mass resolution ion microscopy von Thorne, N. A., Degrève, F.

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Depth profiling by ion microprobe with high mass resolution von Degrève, F., Figaret, R., Laty, P.

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Metallurgical applications of secondary ion mass spectrometry (SIMS) von DEGREVE, F, THORNE, N. A, LANG, J. M

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SIMS study of the SiO2/Si interface and of the Si+O2 system von Degreve, F., Ged, Ph

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Thermochemical study of the germanium oxides using a mass spectrometer. Dissociation energy of the molecule GeO von Drowart, J., Degrève, F., Verhaegen, G., Colin, R.

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Metallurgical Applications of SIMS von Degrève, F., Lang, J. M.

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Review of old chemistry and new catalytic advances in the on-purpose synthesis of butadiene von Makshina, Ekaterina V, Dusselier, Michiel, Janssens, Wout, Degrève, Jan, Jacobs, Pierre A, Sels, Bert F

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Circulating fluidized bed heat recovery/storage and its potential to use coated phase-change-material (PCM) particles von Pitié, F., Zhao, C.Y., Baeyens, J., Degrève, J., Zhang, H.L.

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SIMS study of the SiO 2 /Si interface and of the Si+O 2 system von Degreve, F., Ged, Ph

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New methods for determining hydrogen content in aluminum and its alloys von Degreve, Francis

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Latent heat storage with tubular-encapsulated phase change materials (PCMs) von Zhang, H.L., Baeyens, J., Degrève, J., Cáceres, G., Segal, R., Pitié, F.

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Mathematical modelling of anaerobic digestion of biomass and waste: Power and limitations von Lauwers, Joost, Appels, Lise, Thompson, Ian P., Degrève, Jan, Van Impe, Jan F., Dewil, Raf

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Microroughness induced on solids by ion bombardment: I. Experimental results on sputtering of aluminium by A + (15 keV); quantification of microroughness von Laty, P., Seethanen, D., Degreve, F.

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Microroughness Induced on Solids by Ion Bombardment. I.--Experimental Results on Sputtering of Aluminium by Ar+ (15 keV): Quantification of Microroughness von Laty, P, Seethanen, D, Degreve, F

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Microroughness Induced on Solids by Ion Bombardment. Pt. 1. Experimental Results on Sputtering of Aluminum by Ar exp + (15 keV); Quantification of Microroughness von Laty, P, Seethanen, D, Degreve, F

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Microroughness induced on solids by ion bombardment von Laty, P., Seethanen, D., Degreve, F.

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A simultaneous approach for calibrating Rate Based Models of packed distillation columns based on multiple experiments von Bonilla, J., Logist, F., Huyck, B., Degrève, J., De Moor, B., Van Impe, J.

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