Detecting Fermi-level shifts by Auger electron spectroscopy in Si and GaAs von Debehets, J., Homm, P., Menghini, M., Chambers, S.A., Marchiori, C., Heyns, M., Locquet, J.P., Seo, J.W.

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Detecting Fermi-level shifts by Auger electron spectroscopy in Si and GaAs von Debehets, J., Homm, P., Menghini, M., Chambers, S. A., Marchiori, C., Heyns, M., Locquet, J. P., Seo, J. W.

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Interface Studies of GaAs/MgO-Systems for Metal-Oxide-Semiconductor Capacitor (MOSCAP) Applications von Debehets, J

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