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Spectral reflectance of TiNx and ZrNx films as selective solar absorbers von Blickensderfer, R., Deardorff, D.K., Lincoln, R.L.

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Spectral reflectance of TiN x and ZrN x films as selective solar absorbers von Blickensderfer, R., Deardorff, D.K., Lincoln, R.L.

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New tetragonal compounds Nb 3Si and Ta 3Si von Deardorff, D.K., Siemens, R.E., Romans, P.A., McCune, R.A.

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Normal total emittance at 400–850 K and normal spectral reflectance at room temperature of Be, Hf, Nb, Ta, Ti, V and Zr von Blickensderfer, R., Deardorff, D.K., Lincoln, R.L.

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New tetragonal compounds Nb3Si and Ta3Si von Deardorff, D.K., Siemens, R.E., Romans, P.A., McCune, R.A.

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De Novo Mutations in Protein Kinase Genes CAMK2A and CAMK2B Cause Intellectual Disability von Kury, S., Woerden, G.M. van, Besnard, T., Onori, M.P., Latypova, X., Towne, M.C., Cho, M.T., Prescott, T.E., Ploeg, M.A., Sanders, S., Stessman, H.A.F., Pujol, A., Distel, ben, Robak, L.A., Bernstein, J.A., Denomme-Pichon, A.S., Lesca, G., Sellars, E.A., Berg, J., Carre, W., Busk, O.L., Bon, B.W.M. van, Waugh, J.L., Deardorff, M., Hoganson, G.E., Bosanko, K.B., Johnson, D.S., Dabir, T., Holla, O.L., Sarkar, A., Tveten, K., Bellescize, J. de, Braathen, G.J., Terhal, P.A., Grange, D.K., Haeringen, A. van, Lam, C., Mirzaa, G., Burton, J., Bhoj, E.J., Douglas, J., Santani, A.B., Nesbitt, A.I., Helbig, K.L., Andrews, M.V., Begtrup, A., Tang, S., Gassen, K.L.I. van, Juusola, J., Foss, K., Enns, G.M., Moog, U., Hinderhofer, K., Paramasivam, N., Lincoln, S., Kusako, B.H., Lindenbaum, P., Charpentier, E., Nowak, C.B., Cherot, E., Simonet, T., Ruivenkamp, C.A.L., Hahn, S., Brownstein, C.A., Xia, F., Schmitt, S., Deb, W., Bonneau, D., Nizon, M., Quinquis, D., Chelly, J., Rudolf, G., Sanlaville, D., Parent, P., Gilbert-Dussardier, B., Toutain, A., Peart-Vissers, L.E.L.M., Boisseau, P., Vincent, M., Grabrucker, A.M., Dubourg, C., Tan, W.H., Verbeek, N.E., Granzow, M., Santen, G.W.E., Shendure, J., Isidor, B., Pasquier, L., Redon, R., Yang, Y.P., State, M.W., Kleefstra, T., Cogne, B., Petrovski, S., Retterer, K., Eichler, E.E., Agrawal, P.B., Bezieau, S., Odent, S., Elgersma, Y.

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