Epitaxial diamond-hexagonal silicon nano-ribbon growth on (001) silicon von Qiu, Y., Bender, H., Richard, O., Kim, M.-S., Van Besien, E., Vos, I., de Potter de ten Broeck, M., Mocuta, D., Vandervorst, W.

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Characterization of Triptolide-Induced Hepatotoxicity by Imaging and Transcriptomics in a Novel Zebrafish Model von Vliegenthart, Adriaan D Bastiaan, Wei, Chunmin, Buckley, Charlotte, Berends, Cécile, de Potter, Carmelita M J, Schneemann, Sarah, Del Pozo, Jorge, Tucker, Carl, Mullins, John J, Webb, David J, Dear, James W

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Ni- and Co-based silicides for advanced CMOS applications von Kittl, J.A., Lauwers, A., Chamirian, O., Van Dal, M., Akheyar, A., De Potter, M., Lindsay, R., Maex, K.

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Silicides for the 100-nm node and beyond: Co-silicide, Co(Ni)-silicide and Ni-silicide von Lauwers, A, de Potter, M, Chamirian, O, Lindsay, R, Demeurisse, C, Vrancken, C, Maex, K

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Quantitative prediction of junction leakage in bulk-technology CMOS devices von Duffy, R., Heringa, A., Venezia, V.C., Loo, J., Verheijen, M.A., Hopstaken, M.J.P., van der Tak, K., de Potter, M., Hooker, J.C., Meunier-Beillard, P., Delhougne, R.

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The relation between phase transformation and onset of thermal degradation in nanoscale CoSi2-polycrystalline silicon structures von van Dal, M. J. H., Jawarani, D., van Berkum, J. G. M., Kaiser, M., Kittl, J. A., Vrancken, C., de Potter, M., Lauwers, A., Maex, K.

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The effect of renal dysfunction and haemodialysis on circulating liver specific miR‐122 von Rivoli, Laura, Vliegenthart, A. D. Bastiaan, Potter, Carmelita M. J., Bragt, Job J. M. H., Tzoumas, Nikolaos, Gallacher, Peter, Farrah, Tariq E., Dhaun, Neeraj, Dear, James W.

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Loeys-Dietz syndrome (TGFβR2 mutation) in a 4-year-old child with thoracic aortic aneurysm von De Potter, M-J, Edouard, T, Amadieu, R, Plaisancié, J, Julia, S, Hadeed, K, Hascoët, S, Acar, P, Dulac, Y

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Dose Enhancement Due to Interconnects in Deep-Submicron MOSFETs Exposed to X-Rays von Griffoni, A., Silvestri, M., Gerardin, S., Meneghesso, G., Paccagnella, A., Kaczer, B., de Potter de ten Broeck, M., Verbeeck, R., Nackaerts, A.

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Design Issues and Considerations for Low-Cost 3-D TSV IC Technology von Van der Plas, G, Limaye, P, Loi, I, Mercha, A, Oprins, H, Torregiani, C, Thijs, S, Linten, D, Stucchi, M, Katti, G, Velenis, D, Cherman, V, Vandevelde, B, Simons, V, De Wolf, I, Labie, R, Perry, D, Bronckers, S, Minas, N, Cupac, M, Ruythooren, W, Van Olmen, J, Phommahaxay, A, de Potter de ten Broeck, M, Opdebeeck, A, Rakowski, M, De Wachter, B, Dehan, M, Nelis, M, Agarwal, R, Pullini, A, Angiolini, F, Benini, L, Dehaene, W, Travaly, Y, Beyne, E, Marchal, P

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CMOS Compatible Anodization Process for Low Cost High Density Capacitors von Detalle, Mikael, Rakowski, Michal, Potoms, Goedele, Mercha, Abdelkarim, De Potter de ten Broeck, Muriel, Phommahaxay, Alain, Sabuncuoglu Tezcan, Deniz, Soussan, Philippe

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Reaction of Ni and Si0.8Ge0.2: phase formation and thermal stability von Chamirian, O., Lauwers, A., Kittl, J.A., Dal, M. Van, Potter, M. De, Lindsay, R., Maex, K.

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Efficacy and safety of left atrial appendage closure with WATCHMAN in patients with or without contraindication to oral anticoagulation: 1-Year follow-up outcome data of the EWOLUT... von Boersma, Lucas V., MD, PhD, FESC, Ince, Hueseyin, MD, Kische, Stephan, MD, Pokushalov, Evgeny, MD, PhD, Schmitz, Thomas, MD, Schmidt, Boris, MD, Gori, Tommaso, MD, Meincke, Felix, MD, Protopopov, Alexey Vladimir, MD, PhD, Betts, Timothy, MD, Foley, David, MD, PhD, FRCPI, FACA, FACC, FESC, Sievert, Horst, MD, Mazzone, Patrizio, MD, De Potter, Tom, MD, Vireca, Elisa, Stein, Kenneth, MD, FHRS, Bergmann, Martin W., MD, PhD, FESC

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Gate-source-drain architecture impact on DC and RF performance of sub-100-nm elevated source/drain NMOS transistors von Jeamsaksiri, W., Jurczak, M., Grau, L., Linten, D., Augendre, E., De Potter, M., Rooyackers, R., Wambacq, P., Badenes, G.

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Optimization of low temperature silicon nitride processes for improvement of device performance von Sleeckx, E., Schaekers, M., Shi, X., Kunnen, E., Degroote, B., Jurczak, M., de Potter de ten Broeck, M., Augendre, E.

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Low temperature spike anneal for Ni-silicide formation von Lauwers, A., Kittl, J.A., Van Dal, M., Chamirian, O., Lindsay, R., de Potter, M., Demeurisse, C., Vrancken, C., Maex, K., Pagès, X., Van der Jeugd, K., Kuznetsov, V., Granneman, E.

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Syndrome de Loeys-Dietz (mutation TGFβR2) chez une enfant de 4ans avec anévrysme de l’aorte thoracique von De Potter, M.-J., Edouard, T., Amadieu, R., Plaisancié, J., Julia, S., Hadeed, K., Hascoët, S., Acar, P., Dulac, Y.

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Optimized thermal processing for Ti-capped CoSi2 for 0.13 μm technology von LINDSAY, R, LAUWERS, A, DE POTTER, M, ROELANDTS, N, VRANCKEN, C, MAEX, K

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Comparative study of Ni-silicide and Co-silicide for sub 0.25-μm technologies von Lauwers, A, Besser, P, Gutt, T, Satta, A, de Potter, M, Lindsay, R, Roelandts, N, Loosen, F, Jin, S, Bender, H, Stucchi, M, Vrancken, C, Deweerdt, B, Maex, K

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Study of CoSi2 formation from a Co-Ni alloy von CHAMIRIAN, O, STEEGEN, A, BENDERA, H, LAUWERSA, A, DE POTTER, M, MARABELLIB, F, MAEX, K

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