An experimental assessment of grain size effects in the uniaxial straining of thin Al sheet with a few grains across the thickness von Janssen, P.J.M., de Keijser, Th.H., Geers, M.G.D.

Volltext

X-ray diffraction analysis of stacking and twin faults in f.c.c. metals: a revision and allowance for texture and non-uniform fault probabilities von Velterop, L., Delhez, R., De Keijser, Th. H., Mittemeijer, E. J., Reefman, D.

Volltext

Processing induced size effects in plastic yielding upon miniaturisation von Janssen, P.J.M., Hoefnagels, J.P.M., de Keijser, Th.H., Geers, M.G.D.

Volltext

On the origin of stress in magnetron sputtered TiN layers von Kamminga, J.-D., de Keijser, Th. H., Delhez, R., Mittemeijer, E. J.

Volltext

New methods for diffraction stress measurement: a critical evaluation of new and existing methods von Kamminga, J.-D., De Keijser, Th. H., Mittemeijer, E. J., Delhez, R.

Volltext

A model for stress in thin layers induced by misfitting particles: An origin for growth stress von Kamminga, J.-D, de Keijser, Th.H, Delhez, R, Mittemeijer, E.J

Volltext

Use of the Voigt function in a single-line method for the analysis of X-ray diffraction line broadening von De Keijser, Th. H., Langford, J. I., Mittemeijer, E. J., Vogels, A. B. P.

Volltext

A tool for X-ray diffraction analysis of thin layers on substrates: substrate peak removal method von Kamminga, J.-D., Delhez, R., De Keijser, Th. H., Mittemeijer, E. J.

Volltext

First-Order Size Effects in the Mechanics of Miniaturized Components von Geers, M.G.D., Hoefnagels, J.P.M., Janssen, P.J.M., de Keijser, T.H.

Volltext

Changes in the densities of dislocations on distinct slip systems during stress relaxation in thin aluminium layers: The interpretation of x-ray diffraction line broadening and lin... von Vermeulen, A. C., Delhez, R., de Keijser, Th. H., Mittemeijer, E. J.

Volltext

On precipitation in rapidly solidified aluminium-silicon alloys von VAN MOURIK, P, MITTEMEIJER, E. J, DE KEIJSER, T. H

Volltext

Characterization of Al-Si-alloys rapidly quenched from the melt von Bendijk, A., Delhez, R., Katgerman, L., De Keijser, Th. H., Mittemeijer, E. J., Van Der Pers, N. M.

Volltext

Morphology and mechanical properties of melt-spun and conventionally cast aluminium, AlMg and AlSi alloys before and after hot extrusion von VAN ROOYEN, M, COLIJN, P. F, DE KEIJSER, T. H, MITTEMEIJER, E. J

Volltext

Diffraction-Line Broadening due to Strain Fields in Materials; Fundamental Aspects and Methods of Analysis von Van Berkum, J. G. M., Delhez, R., De Keijser, Th. H., Mittemeijer, E. J.

Volltext

Composition, microstructure, and properties of crystalline molybdenum silicide thin films produced by annealing of amorphous Mo/Si multilayers von LOOPSTRA, O. B, SLOOF, W. G, DE KEIJSER, T. H, MITTEMEIJER, E. J, RADELAAR, S, KUIPER, A. E. T, WOLTERS, R. A. M

Volltext

Model for stress and volume changes of a thin film on a substrate upon annealing: Application to amorphous Mo/Si multilayers von Loopstra, OB, van Snek ER, de Keijser TH, Mittemeijer, EJ

Volltext

Precipitation in liquid-quenched Al-Mg alloys. A study using X-ray diffraction line shift and line broadening von VAN MOURIK, P, MAASWINKEL, N. M, DE KEIJSER, T. H, MITTEMEIJER, E. J

Volltext

Analysis of Strain Fields by Means of Diffraction-Line Broadening von Van Berkum, J.G.M., Delhez, Rob, Mittemeijer, Eric Jan, de Keijser, T.H.

Volltext

Representation of tails of periodic and infinite-range signals : towards a treatment for truncation von VERMEULEN, A. C, DELHEZ, R, DE KEIJSER, T. H, MITTEMEIJER, E. J

Volltext

Development and partial relaxation of internal stresses in thin TiC layers chemically vapour deposited on Fe-C substrates von SLOOF, W. G, DELHEZ, R, DE KEIJSER, T. H, MITTEMEIJER, E. J

Volltext