A comparison of performance of flat and bent photovoltaic luminescent solar concentrators von Vishwanathan, B., Reinders, A.H.M.E., de Boer, D.K.G., Desmet, L., Ras, A.J.M., Zahn, F.H., Debije, M.G.

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Progress in phosphors and filters for luminescent solar concentrators von de Boer, D.K.G, Broer, D.J, Debije, M.G, Keur, W, Meijerink, A, Ronda, R.C, Verbunt, P.P.C

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Specular and non-specular X-ray reflection from inorganic and organic multilayers von de Boer, D.K.G, Leenaers, A.J.G, van der Wielen, M.W.J, Cohen Stuart, M.A, Fleer, G.J, Nieuwhof, R.P, Marcelis, A.T.M, Sudhölter, E.J.R

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1.1 : Optical Response of Structured Vertically Aligned and In-Plane Switchng LCDs(DINAMICS OF LCD)(Report on 20th IDRC) von Boer, D.K.G. de, Johnson, M.T., Haaren, J.A.M.M. van, Fukumoto, M., Yoshiga, M., Hamawaki, Y., Unate, T., Fernandez, F.A., Day, S.E.

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Order in Thin Films of Side-Chain Liquid-Crystalline Polymers von van der Wielen, M. W. J, Cohen Stuart, M. A, Fleer, G. J, de Boer, D. K. G, Leenaers, A. J. G, Nieuwhof, R. P, Marcelis, A. T. M, Sudhölter, E. J. R

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X-ray Standing Waves and the critical sample thickness for Total-reflection von de Boer, D.K.G.

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Total reflection X-ray fluorescence analysis and related methods von De Boer, D.K.G., Klockenkaemper, R.

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GIXA, a Novel Technique in Near-Surface Analysis von De Boer, D.K.G., Hoogenhof, W.V.D.

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Glancing incidence X-ray analysis: more than just reflectivity von Leenaers, A.J.G, Vrakking, J.J.A.M, de Boer, D.K.G

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X-ray Standing Waves and the critical sample thickness for Total-reflection: X-Ray Fluorescence analysis von de Boer, D.K.G.

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Europhysics Industrial Workshop: Exploiting X-rays at the Nanoscale Continues to Challenge von de Boer, D.K.G., Chauvineau, J.P.

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Fundamental parameters for X-ray fluorescence analysis von de Boer, D.K.G.

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Glancing-Incidence X-Ray Analysis of Thin Films von De Boer, D.K.G., van den Hoogenhof, W.W.

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Glancing-incidence X-ray analysis von Van Den Hoogenhof, W.W., De Boer, D.K.G.

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Total reflection X-ray fluorescence of single and multiple thin-layer samples von De Boer, D.K.G., Van Den Hoogenhof, W.W.

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Ellipsoid X-ray focussing for synchrotron-radiation microprobe analysis at the SRS, Daresbury, UK von van Langevelde, F., Bowen, D.K., Tros, G.H.J., Vis, R.D., Huizing, A., De Boer, D.K.G.

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Extended study on liquid crystal photoanisotropic polarization gratings beyond the small angle approximation von Man Xu, Urbach, H.P., van Heesch, C.M., de Boer, D.K.G.

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XPS core level line shapes in metallic compounds: A probe for the nature of the electrons at the Fermi level von Folmer, J.C.W., de Boer, D.K.G.

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CrSe2, a new layered dichalcogenide von van Bruggen, C.F., Haange, R.J., Wiegers, G.A., de Boer, D.K.G.

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Growth of a single-domain smectic phase in a thin liquid-crystalline polymer film von van der Wielen, M W, Cohen Stuart, M A, Fleer, G J, Schlatmann, A R, de Boer, D K

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