Mechanisms Limiting EOT Scaling and Gate Leakage Currents of High- k/Metal Gate Stacks Directly on SiGe von Huang, J., Kirsch, P.D., Jungwoo Oh, Se Hoon Lee, Majhi, P., Harris, H.R., Gilmer, D.C., Bersuker, G., Dawei Heh, Chang Seo Park, Park, C., Hsing-Huang Tseng, Jammy, R.

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Impact of Semiconductor and Interface-State Capacitance on Metal/High-k/GaAs Capacitance-Voltage Characteristics von Sonnet, A M, Hinkle, C L, Dawei Heh, Bersuker, G

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High K Nanophase Zinc Oxide on Biomimetic Silicon Nanotip Array as Supercapacitors von Han, Hsieh-Cheng, Chong, Cheong-Wei, Wang, Sheng-Bo, Heh, Dawei, Tseng, Chi-Ang, Huang, Yi-Fan, Chattopadhyay, Surojit, Chen, Kuei-Hsien, Lin, Chi-Feng, Lee, Jiun-Haw, Chen, Li-Chyong

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Spatial distributions of trapping centers in HfO2∕SiO2 gate stacks von Heh, Dawei, Young, Chadwin D., Brown, George A., Hung, P. Y., Diebold, Alain, Bersuker, Gennadi, Vogel, Eric M., Bernstein, Joseph B.

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Gated Diode Investigation of Bias Temperature Instability in High- \kappa FinFETs von Young, Chadwin D, Neugroschel, Arnost, Matthews, Kenneth, Smith, Casey, Dawei Heh, Hokyung Park, Hussein, Muhammad M, Taylor, William, Bersuker, Gennadi

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Pulsed [Formula Omitted]- [Formula Omitted] Methodology and Its Application to Electron-Trapping Characterization and Defect Density Profiling von Young, C.D, Yuegang Zhao, Yuegang Zhao, Dawei Heh, Dawei Heh, Rino Choi, Rino Choi, Byoung Hun Lee, Byoung Hun Lee, Bersuker, G

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Electric-field-driven dielectric breakdown of metal-insulator-metal hafnium silicate von Lee, Byoung Hun, Kang, Chang Yong, Kirsch, Paul, Heh, Dawei, Young, Chadwin D., Park, Hongbae, Yang, Jiwoon, Bersuker, Gennadi, Krishnan, Siddarth, Choi, Rino, Lee, Hi-Deok

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Pulsed I- V Methodology and Its Application to Electron-Trapping Characterization and Defect Density Profiling von Young, C.D., Yuegang Zhao, Dawei Heh, Rino Choi, Byoung Hun Lee, Bersuker, G.

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The Pulsed Id-Vg methodology and Its Application to the Electron Trapping Characterization of High-κ gate Dielectrics von Chadwin D. Young, Dawei Heh, Rino Choi, Byoung Hun Lee, Gennadi Bersuker

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Total Ionization Radiation Sensor Performance Improvement by Using Si-rich MONOS Device von Hsieh, Wen-Ching, Daniel Lee, Hao-Tien, Jon, Fuh-Cheng, Wu, Shich-Chuan, Heh, Dawei, Tsai, Tzu-I

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Electrical characterization and analysis techniques for the high- κ era von Young, Chadwin D., Heh, Dawei, Neugroschel, Arnost, Choi, Rino, Lee, Byoung Hun, Bersuker, Gennadi

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Pulsed I d a V g Methodology and Its Application to Electron-Trapping Characterization and Defect Density Profiling von Young, C D, Zhao, Yuegang, Heh, Dawei, Choi, Rino, Lee, Byoung Hun, Bersuker, G

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Fast and slow charge trapping/detrapping processes in high-k nMOSFETs von Dawei Heh, Rino Choi, Young, C.D., Bersuker, G.

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Mobility reduction and reliability assessment of high-k/metal gate stacks in deep sub-nanometer EOT region von Dawei Heh, Bersuker, G., Huang, J., Kirsch, P.D., Hsing-Huang Tseng, Jammy, R.

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Stress-induced defect generation in HfO2/SiO2 stacks observed by using charge pumping and low frequency noise measurements von Xiong, H.D., Dawei Heh, Shuo Yang, Xiaoxiao Zhu, Gurfinkel, M., Bersuker, G., Ioannou, D.E., Richter, C.A., Cheung, K.P., Suehle, J.S.

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A new dielectric degradation phenomenon in nMOS high-k devices under positive bias stress von Dawei Heh, Kirsch, P.D., Young, C.D., Bersuker, G.

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Temperature effects on metal-alumina-nitride-oxide-silicon memory operations von Padovani, Andrea, Larcher, Luca, Heh, Dawei, Bersuker, Gennadi, Della Marca, Vincenzo, Pavan, Paolo

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Experimental Evidence of the Fast and Slow Charge Trapping/Detrapping Processes in High- k Dielectrics Subjected to PBTI Stress von Heh, D., Young, C.D., Bersuker, G.

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Pulsed Id―Vg Methodology and Its Application to Electron-Trapping Characterization and Defect Density Profiling von YOUNG, Chadwin D, YUEGANG ZHAO, HEH, Dawei, CHOI, Rino, BYOUNG HUN LEE, BERSUKER, Gennadi

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Plasma induced damage of aggressively scaled gate dielectric (EOT ≪ 1.0nm) in metal gate/high-k dielectric CMOSFETs von Kyung Seok Min, Chang Yong Kang, Ook Sang Yoo, Byoung Jae Park, Sung Woo Kim, Young, C.D., Dawei Heh, Bersuker, G., Byoung Hun Lee, Geun Young Yeom

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