Evaluation of inelastic energy losses for low-energy Ne + ions scattered from aluminum and silicon surfaces von Tolstogouzov, A., Daolio, S., Pagura, C.

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Energy distributions of secondary ions sputtered from aluminium and magnesium by Ne+, Ar+ and O2+: a comprehensive study von Tolstogouzov, A, Daolio, S, Pagura, C, Greenwood, C.L

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Surgical outcomes of patients with diffuse-type tenosynovial giant-cell tumours: an international, retrospective, cohort study von Mastboom, Monique J L, Palmerini, Emanuela, Verspoor, Floortje G M, Rueten-Budde, Anja J, Stacchiotti, Silvia, Staals, Eric L, Schaap, Gerard R, Jutte, Paul C, Aston, Will, Gelderblom, Hans, Leithner, Andreas, Dammerer, Dietmar, Takeuchi, Akihiko, Thio, Quirina, Niu, Xiaohui, Wunder, Jay S, Fiocco, M., Dijkstra, P.D.S., Van der Wal, R.J.P., Daolio, P.A., Picci, P., Gronchi, A., Ferrari, S., Özger, H., Maki, R.G., Schreuder, H.W.B., Van der Geest, I.C.M., Bramer, J.A.M., Mastboom, W.J.B., Boffano, M., Goldenitsch, E., Campanacci, D., Cuomo, P., Ferguson, P.C., Griffin, A.M., Sun, Y., Schubert, T., Patel, K., Aranguren, M.S.J., Blancheton, A., Gouin, F., Dürr, H.R., Capellen, C.F., Schwab, J., Iwata, S., Vyrva, O., Weschenfelder, W., Wang, E.H.M., Wook Joo, M., Kang, Y.K., Chung, Y.G., Ebeid, W., Bruns, J., Ueda, T., van de Sande, Michiel A J

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Mass-resolved ion scattering spectrometry for characterization of samples with historical value von Daolio, S, Pagura, C, Tolstogouzov, A

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MARISS study on ion yields of Ne + scattered from III–V compound semiconductors von Tolstogouzov, A, Daolio, S, Pagura, C

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Hyperthermal and low-energy Ne + scattering from Au and Pt surfaces von Tolstogouzov, A., Daolio, S., Pagura, C.

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No Impact of Corticosteroid Use During the Acute Phase on Persistent Symptoms Post-COVID-19 von Ko, Adrien Chan Sui, Candellier, Alexandre, Mercier, Marie, Joseph, Cedric, Carette, Hortense, Basille, Damien, Lion-Daolio, Sylvie, Devaux, Stephanie, Schmit, Jean-Luc, Lanoix, Jean-Philippe, Andrejak, Claire

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Adsorption of n-pentanol from KPF6 aqueous solution on the (100) and (110) faces of Ag single crystal electrodes von DOUBOVA, L. M, DE BATTISTI, A, DAOLIO, S, TRASATTI, S

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Surface chemistry of RuO2/IrO2/TiO2 mixed-oxide electrodes: secondary ion mass spectrometric study of the changes induced by electrochemical treatment von Barison, S., De Battisti, A., Fabrizio, M., Daolio, S., Piccirillo, C.

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Vector Generation and Operations in Neural Networks Computations von Ishii, Naohiro, Deguchi, Toshinori, Kawaguchi, Masashi, Sasaki, Hiroshi

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Surgical Treatment of Localized-Type Tenosynovial Giant Cell Tumors of Large Joints: A Study Based on a Multicenter-Pooled Database of 31 International Sarcoma Centers von Mastboom, M.J.L., Staals, E.L., Verspoor, F.G.M., Rueten-Budde, A.J., Stacchiotti, S., Palmerini, E., Schaap, G.R., Jutte, P.C., Aston, W., Leithner, A., Dammerer, D., Takeuchi, A., Thio, Q., Niu, X., Wunder, J.S., van de Sande, M.A.J.

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Hyperphagic access von Choirat, D, Oukachbi, Z, Le Page, L, Lion-Daolio, S, Caillierez, J, Ducroix, J-P

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Neutralization of low-energy Ne + ions scattered from metal surfaces: study by mass-resolved ion-scattering spectrometry von Tolstogouzov, A., Daolio, S., Pagura, C., Greenwood, C.L.

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Energy distributions of Ga+ and In+ secondary ions sputtered from AIIIBV compound semiconductors by noble gas ions: Mass-dependence of the high-energy yield on the second component... von Tolstogouzov, A., Daolio, S., Pagura, C., Greenwood, C.L., Karpuzov, D.S., McIntyre, N.S.

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Characterisation of surface oxidation of nickel–titanium alloy by ion-beam and electrochemical techniques von Barison, Simona, Cattarin, Sandro, Daolio, Sergio, Musiani, Marco, Tuissi, Ausonio

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Characterization of Dispersion-Hardened Electrodeposited Gold Composites. Part 1:  SIMS and SEM Study of Powder Inclusions von Barison, S, Daolio, S, Fabrizio, M, Piccirillo, C, Calliari, I, Armelao, L

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Study of Metal Oxide Electrocatalytic Thin Film Evolution by Thermoanalytical and Spectroscopic Techniques—a Review von Kristóf, J., Horváth, E., Daolio, S.

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Un accès hyperphagique von Choirat, D., Oukachbi, Z., Le Page, L., Lion-Daolio, S., Caillierez, J., Ducroix, J.-P.

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Mutually reactive elements in a glass host matrix: Ag and S ion implantation in silica von Bertoncello, R., Gross, S., Trivillin, F., Cattaruzza, E., Mattei, G., Caccavale, F., Mazzoldi, P., Battaglin, G., Daolio, S.

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Investigations on the Formation of RuO2/ZrO2-Based Electrocatalytic Thin Films by Surface Analysis Techniques von Kristóf, J, Daolio, S, De Battisti, A, Piccirillo, C, Mihály, J, Horváth, E

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