Self-heating of stressed VDMOS devices under specific operating conditions von Veljković, S., Mitrović, N., Jovanović, I., Živanović, E., Paskaleva, A., Spassov, D., Mančić, D., Danković, D.

Volltext

Radiation and annealing related effects in NBT stressed P-channel power VDMOSFETs von Danković, D., Davidović, V., Golubović, S., Veljković, S., Mitrović, N., Djorić-Veljković, S.

Volltext

Impact of negative bias temperature instability on p-channel power VDMOSFET used in practical applications von Mitrović, N., Veljković, S., Davidović, V., Djorić-Veljković, S., Golubović, S., Živanović, E., Prijić, Z., Danković, D.

Volltext

NBTI and irradiation related degradation mechanisms in power VDMOS transistors von Stojadinović, N., Djorić-Veljković, S., Davidović, V., Golubović, S., Stanković, S., Prijić, A., Prijić, Z., Manić, I., Danković, D.

Volltext

A review of pulsed NBTI in P-channel power VDMOSFETs von Danković, D., Manić, I., Prijić, A., Davidović, V., Prijić, Z., Golubović, S., Djorić-Veljković, S., Paskaleva, A., Spassov, D., Stojadinović, N.

Volltext

Burial of a woman with an amber distaff at Viminacium von Dankovic, Ilija

Volltext

Anthropomorphic amulets from Viminacium von Milovanovic, Bebina, Dankovic, Ilija

Volltext

Negative bias temperature instability mechanisms in p-channel power VDMOSFETs von Stojadinović, N., Danković, D., Djorić-Veljković, S., Davidović, V., Manić, I., Golubović, S.

Volltext

NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions von MANIC, I, DANKOVIC, D, PRIJIC, A, DAVIDOVIC, V, DJORIC-VELJKOVIC, S, GOLUBOVIC, S, PRIJIC, Z, STOJADINOVIC, N

Volltext

A method for negative bias temperature instability (NBTI) measurements on power VDMOS transistors von Priji, A, Dankovi, D, Vra ar, Lj, Mani, I, Priji, Z, Stojadinovi, N

Volltext

NBT stress-induced degradation and lifetime estimation in p-channel power VDMOSFETs von DANKOVIC, D, MANIC, I, DJORIC-VELJKOVIC, S, DAVIDOVIC, V, GOLUBOVIC, S, STOJADINOVIC, N

Volltext

Threshold voltage instabilities in p-channel power VDMOSFETs under pulsed NBT stress von STOJADINOVIC, N, DANKOVIC, D, MANIC, I, PRIJIC, A, DAVIDOVIC, V, DJORIC-VELJKOVIC, S, GOLUBOVIC, S, PRIJIC, Z

Volltext

Effects of low gate bias annealing in NBT stressed p-channel power VDMOSFETs von MANIC, I, DANKOVIC, D, DJORIC-VELJKOVIC, S, DAVIDOVIC, V, GOLUBOVIC, S, STOJADINOVIC, N

Volltext

Negative bias temperature instability in n-channel power VDMOSFETs von Danković, D., Manić, I., Davidović, V., Djorić-Veljković, S., Golubović, S., Stojadinović, N.

Volltext

Negative bias temperature instabilities in sequentially stressed and annealed p-channel power VDMOSFETs von DANKOVIC, D, MANIC, I, DAVIDOVIC, V, DJORIC-VELJKOVIC, S, GOLUBOVIC, S, STOJADINOVIC, N

Volltext

Modeling of Static Negative Bias Temperature Stressing in p-channel VDMOSFETs using Least Square Method von N. Mitrović, D. Danković, B. Ranđelović, Z. Prijić, N. Stojadinović

Volltext

Occupational exposure to chrysotile asbestos and cancer risk: a review of the amphibole hypothesis von Stayner, L T, Dankovic, D A, Lemen, R A

Volltext

Spontaneous Abortion, Sex Ratio, and Paternal Occupational Exposure to 2,3,7,8-Tetrachlorodibenzo-p-Dioxin von Schnorr, Teresa M., Lawson, Christina C., Whelan, Elizabeth A., Dankovic, David A., Deddens, James A., Piacitelli, Laurie A., Reefhuis, Jennita, Sweeney, Marie H., Connally, L. Barbara, Fingerhut, Marilyn A.

Volltext

Effects of electrical stressing in power VDMOSFETs von Stojadinovic, N., Manic, I., Davidovic, V., Dankovic, D., Djoric-Veljkovic, S., Golubovic, S., Dimitrijev, S.

Volltext

Rat- and human-based risk estimates of lung cancer from occupational exposure to poorly-soluble particles: A quantitative evaluation von Kuempel, E D, Smith, R J, Dankovic, D A, Stayner, L T

Volltext