The Importance of Students' Practical Work in High Schools for Higher Education in Electronic Engineering von Dankovic, Danijel, Marjanovic, Milos, Mitrovic, Nikola, Zivanovic, Emilija, Dankovic, Milan, Prijic, Aneta, Prijic, Zoran

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A Reliability Investigation of VDMOS Transistors: Performance and Degradation Caused by Bias Temperature Stress von Živanović, Emilija, Veljković, Sandra, Mitrović, Nikola, Jovanović, Igor, Djorić-Veljković, Snežana, Paskaleva, Albena, Spassov, Dencho, Danković, Danijel

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Implementation and testing of WebSocket protocol in ESP32 based IoT systems von Mitrovic, Nikola, Djordjevic, Milan, Veljkovic, Sandra, Dankovic, Danijel

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Negative bias temperature instability in p-channel power VDMOSFETs: recoverable versus permanent degradation von Dankovi, Danijel, Mani, Ivica, Priji, Aneta, Djori -Veljkovi, Sne ana, Davidovi, Vojkan, Stojadinovi, Ninoslav, Priji, Zoran, Golubovi, Sne ana

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Effects of consecutive irradiation and bias temperature stress in p-channel power vertical double-diffused metal oxide semiconductor transistors von Davidovi, Vojkan, Dankovi, Danijel, Ili, Aleksandar, Mani, Ivica, Golubovi, Sne ana, Djori -Veljkovi, Sne ana, Priji, Zoran, Priji, Aneta, Stojadinovi, Ninoslav

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Analysis of recoverable and permanent components of threshold voltage shift in NBT stressed p-channel power VDMOSFET von Dankovic, Danijel, Stojadinovic, Ninoslav, Prijic, Zoran, Manic, Ivica, Davidovic, Vojkan, Prijic, Aneta, Djoric-Veljkovic, Snezana, Golubovic, Snezana

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Annealing influence on recovery of electrically stressed power vertical double-diffused metal oxide semiconductor transistors von Djori -Veljkovi, Sne ana, Mani, Ivica, Davidovi, Vojkan, Dankovi, Danijel, Golubovi, Sne ana, Stojadinovi, Ninoslav

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EXTRACURRICULAR ACTIVITIES IN THE FUNCTION OF IMPROVING PRACTICAL SKILLS OF FUTURE STUDENTS IN THE FIELD OF ЕLECTRICAL ENGINEERING AND COMPUTING von Živanović, Emilija, Marjanović, Miloš, Danković, Danijel

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Turn-Around of Threshold Voltage in Gate Bias Stressed p-Channel Power Vertical Double-Diffused Metal–Oxide–Semiconductor Transistors von Davidović, Vojkan, Stojadinović, Ninoslav, Danković, Danijel, Golubović, Snežana, Manić, Ivica, Djorić-Veljković, Snežana, Dimitrijev, Sima

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NBTI and Irradiation Effects in P-Channel Power VDMOS Transistors von Davidovic, Vojkan, Dankovic, Danijel, Ilic, Aleksandar, Manic, Ivica, Golubovic, Snezana, Djoric-Veljkovic, Snexana, Prijic, Zoran, Stojadinovic, Ninoslav

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Smart autonomous agricultural system for improving yields in greenhouse based on sensor and IoT technology von Đorđević, Miloš, Paunović, Vesna, Danković, Danijel, Jovičić, Branislav

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Modeling of NBTI degradation in p-channel VDMOSFETs von Mitrović, Nikola, Danković, Danijel, Prijić, Zoran, Stojadinović, Ninoslav

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Poly(acrylamide-co-itaconic acid) and Semi-IPNS with Poly(ethylene glycol): Preparation and Characterization von KRUSIC, Melina Kalagasidis, DANKOVIC, Danijel, NIKOLIC, Marija, FILIPOVIC, Jovanka

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The comparison of gamma-radiation and electrical stress influences on oxide and interface defects in power VDMOSFET von Djoric-Veljkovic, Snezana, Manic, Ivica, Davidovic, Vojkan, Dankovic, Danijel, Golubovic, Snezana, Stojadinovic, Ninoslav

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Annealing of radiation-induced defects in burn-in stressed power VDMOSFETs von Djoric-Veljkovic, Snezana, Manic, Ivica, Davidovic, Vojkan, Dankovic, Danijel, Golubovic, Snezana, Stojadinovic, Ninoslav

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2023 International Conference on Microelectronics [Chapters] von Veljkovic, Sandra, Zivanovic, Emilija, Davidovic, Vojkan, Dankovic, Danijel

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Let’s All Go to the 16th IEEESTEC! [Chapters] von Veljkovic, Sandra, Marjanovic, Milos, Zivanovic, Emilija, Dankovic, Danijel

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Modeling and PSPICE simulation of NBTI effects in VDMOS transistors von Marjanovic, Milos, Dankovic, Danijel, Prijic, Aneta, Prijic, Zoran, Jankovic, Nebojsa, Davidovic, Vojkan

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Analysis of recoverable and permanent components of threshold voltage shift in NBT stressed p-channel power VDMOSFET Project supported by the Fund from the Ministry of Education, S... von Danković, Danijel, Stojadinović, Ninoslav, Prijić, Zoran, Manić, Ivica, Davidović, Vojkan, Prijić, Aneta, Djorić-Veljković, Snežana, Golubović, Snežana

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Effects of pulsed negative bias temperature stressing in p-channel power VDMOSFETs von Manic, Ivica, Dankovic, Danijel, Davidovic, Vojkan, Prijic, Aneta, Djoric-Veljkovic, Snezana, Golubovic, Snezana, Prijic, Zoran, Stojadinovic, Ninoslav

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