Comparative analysis of safety and efficacy of photorefractive keratectomy versus photorefractive keratectomy combined with crosslinking von Sachdev, Gitansha Shreyas, Ramamurthy, Shreyas, Dandapani, Ramamurthy

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An implementation of IEEE 1149.1 to avoid timing violations and other practical in-compliance improvements von Stang, D., Dandapani, R.

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Structure and metrology for a single-wire analog testability bus von Yunsheng Lu, Weiwei Mao, Dandapani, R., Gulati, R.K.

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On the Design of Logic Networks with Redundancy and Testability Considerations von Dandapani, R., Reddy, S.M.

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Neural networks as massively parallel automatic test pattern generators von Majumder, A., Dandapani, R.

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Integration of IEEE STD.11149.1 and mixed-signal test architectures von Cheek, D.J., Dandapani, R.

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Scan Design Using Standard Flip-Flops von Reddy, Sudhakar M., Dandapani, R.

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Test generation for linear analog circuits von Weiwei Mao, Yunsheng Lu, Gulati, R.K., Dandapani, R.

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Derivation of Minimal Test Sets for Monotonic Logic Circuits von Dandapani, Ramaswami

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Testable Design of Single-Output Sequential Machines Using Checking Experiments von Saluja, Dandapani

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Coverage metrics for functional tests von Wallack, J.R., Dandapani, R.

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An Alternative to Scan Design Methods for Sequential Machines von SALUJA, K. K, RAMASWAMI DANDAPANI

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Hard faults diagnosis in analog circuits using sensitivity analysis von Yunsheng Lu, Dandapani, R.

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SOCIAL NETWORK-BASED INVESTMENT GUIDANCE von ADAMS GREG D, DANDAPANI KUMAR R, AMATO TIMOTHY W

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A new BIST scheme for CMOS PLAs von Chandramouli, V., Gulati, R.K., Dandapani, R.

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SYSTEM AND METHOD FOR MEAN ESTIMATION FOR A TORSO-HEAVY TAIL DISTRIBUTION von YARLAGADDA MITHUN, ADAMS GREG D, DANDAPANI KUMAR R, KARANTH GURUDEV, AMATO TIMOTHY W, DOU YIPING, THRALL ANTHONY DOUGLAS

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Bridging faults and their implication to PLAs von Chandramouli, V., Gulati, R.K., Dandapani, R., Goel, D.K.

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A Plasmid-Based Fluorescence Reporter System for Monitoring Oxidative Damage in E. coli von Dandapani, Hariharan, Kankaanpää, Pasi, Jones, Patrik R., Kallio, Pauli

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Built-in self-test for large embedded CMOS folded PLAs von Dandapani, R., Gulati, R.K., Goel, D.K.

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A Plasmid-Based Fluorescence Reporter System for Monitoring Oxidative Damage in IE. coli/I von Dandapani, Hariharan, Kankaanpää, Pasi, Jones, Patrik R, Kallio, Pauli

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