Monitoring of aging properties of AlGaAs high-power laser arrays von Tomm, J. W., Bärwolff, A., Menzel, U., Voss, M., Puchert, R., Elsaesser, Th, Daiminger, F. X., Heinemann, S., Luft, J.

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Analysis of degradation mechanisms in high power AlGaAs 808 nm laser bars von Arias, J., Esquivias, I., Daiminger, F.X., Heineman, S., Vassilakis, E., Hirtz, J.P.

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Defect Accumulation In High-power Laser Diode Arrays Detected By Photocurrent Analysis von Tomm, J.W., BarWolff, A., Menzel, U., Jaeger, A., Elsaesser, T., Daiminger, F.X., Heinemann, S.

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Spectroscopic measurement of packaging induced strains in high-power laser diode arrays von Tomm, J.W., Muller, R., Barwolff, A., Elsaesser, T., Gerhardt, A., Donecker, J., Lorenzen, D., Daiminger, F.X., Weiss, S., Hutter, M., Reichl, H.

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Photoluminescence microscopy of mirror facets of broad area laser diodes von Andrianov, A.V., Dods, S.R.A., Morgan, J., Orton, J.W., Harrison, I., Larkins, E.C., Daiminger, F.X., Vassilakis, E., Hirtz, J.P.

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