High performance fully-depleted tri-gate CMOS transistors von Doyle, B.S., Datta, S., Doczy, M., Hareland, S., Jin, B., Kavalieros, J., Linton, T., Murthy, A., Rios, R., Chau, R.

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Producer perceptions of dairy calf management, behavior, and welfare von Doyle, S.B., Wickens, C.L., Van Os, J.M.C., Miller-Cushon, E.K.

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Development of human-directed behavior in dairy calves reared individually or in pairs von Doyle, S B, Lindner, E E, Gingerich, K N, Miller-Cushon, E K

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Influences of human contact following milk-feeding on nonnutritive oral behavior and rest of individual and pair-housed dairy calves during weaning von Doyle, S.B., Miller-Cushon, E.K.

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The generation and characterization of electron and hole traps created by hole injection during low gate voltage hot-carrier stressing of n-MOS transistors von Doyle, B.S., Bourcerie, M., Bergonzoni, C., Benecchi, R., Bravis, A., Mistry, K.R., Boudou, A.

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Examination of the time power law dependencies in hot carrier stressing of n-MOS transistors von Doyle, B.S., Mistry, K.R., Faricelli, J.

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Formation of ultrathin nitrided SiO2 oxides by direct nitrogen implantation into silicon von SOLEIMANI, H. R, DOYLE, B. S, PHILIPOSSIAN, A

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Infantile Blount Disease: Long-Term Follow-up of Surgically Treated Patients at Skeletal Maturity von Doyle, Brian S, Volk, Albert G, Smith, Chadwick F

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Rapid estimation of the range-Doppler scattering function von Kay, S.M., Doyle, S.B.

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The gluteus maximus muscle-splitting myocutaneous flap for treatment of sacral and coccygeal pressure ulcers von SALAH RUBAYI, DOYLE, B. S

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Anomalous hot-carrier behavior for LDD p-channel transistors von Doyle, B.S., Mistry, K.R.

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A lifetime prediction method for hot-carrier degradation in surface-channel p-MOS devices von Doyle, B.S., Mistry, K.R.

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The characterization of hot carrier damage in p-channel transistors von Doyle, B.S., Mistry, K.R.

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Irreducible Open Intertrochanteric Hip Fracture Secondary to Entrapment of the Sciatic Nerve in a Child von Wiss, Donald A, Doyle, Brian S

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Analysis of gate oxide thickness hot carrier effects in surface channel P-MOSFET's von Doyle, B.S., Mistry, K.R., Cheng-Liang Huang

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Examination of gradual-junction p-MOS structures for hot carrier control using a new lifetime extraction method von Doyle, B.S., Mistry, K.R., Jackson, D.B.

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Circuit design guidelines for n-channel MOSFET hot carrier robustness von Mistry, K.R., Fox, T.F., Preston, R.P., Arora, N.D., Doyle, B.S., Nelsen, D.E.

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Anomalous low-frequency resonance-type behaviour and negative capacitance in doped glasses von Doyle, B S

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Examination of oxide damage during high-current stress of n-MOS transistors von Doyle, B.S., Krakauer, D.B., Mistry, K.R.

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New hot carrier failure criterion for p-channel transistors based on transistor leakage currents von Doyle, B.S., Mistry, K.R.

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