Very-High Dynamic Range, 10,000 Frames/Second Pixel Array Detector for Electron Microscopy von Philipp, Hugh T., Tate, Mark W., Shanks, Katherine S., Mele, Luigi, Peemen, Maurice, Dona, Pleun, Hartong, Reinout, van Veen, Gerard, Shao, Yu-Tsun, Chen, Zhen, Thom-Levy, Julia, Muller, David A., Gruner, Sol M.

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Wide Dynamic Range, 10 kHz Framing Detector for 4D-STEM von Philipp, Hugh, Tate, Mark, Shanks, Katherine, Mele, Luigi, Peemen, Maurice, Dona, Pleun, Hartong, Reinout, van Veen, Gerard, Shao, Yu-Tsun, Gruner, Sol, Thom-Levy, Julia, Muller, David

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A MEMS-based heating holder for the direct imaging of simultaneous in-situ heating and biasing experiments in scanning/transmission electron microscopes von Mele, Luigi, Konings, Stan, Dona, Pleun, Evertz, Francis, Mitterbauer, Christoph, Faber, Pybe, Schampers, Ruud, Jinschek, Joerg R.

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Very-High Dynamic Range, 10,000 frames/second Pixel Array Detector for Electron Microscopy von Philipp, Hugh T, Tate, Mark W, Shanks, Katherine S, Mele, Luigi, Peemen, Maurice, Pleun Dona, Hartong, Reinout, Gerard van Veen, Yu-Tsun Shao, Chen, Zhen, Thom-Levy, Julia, Muller, David A, Gruner, Sol M

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POLE PIECE INCORPORATING OPTICAL CAVITY FOR IMPROVED PHASE-CONTRAST IN ELECTRON MICROSCOPE IMAGING von BUIJSSE, Bart, DONA, Pleun

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POLE PIECE INCORPORATING OPTICAL CAVITY FOR IMPROVED PHASE-CONTRAST IN ELECTRON MICROSCOPE IMAGING von Buijsse, Bart, Dona, Pleun

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Live Imaging of Reversible Domain Evolution in BaTiO 3 on the Nanometer Scale Using in-situ STEM and TEM von Schilling, Alina, Barton, Bastian, Jinschek, Joerg R., Mele, Luigi, Dona, Pleun, Ringnalda, Jan, Arredondo, Miryam, Einsle, Joshua F., Gregg, Marty

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Reduction of thermal magnetic field noise in TEM corrector systems von Dona, Pleun, Henstra, Alexander

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Live Imaging of Reversible Domain Evolution in BaTiO3 on the Nanometer Scale Using in-situ STEM and TEM von Schilling, Alina, Barton, Bastian, Jinschek, Joerg R., Mele, Luigi, Dona, Pleun, Ringnalda, Jan, Arredondo, Miryam, Einsle, Joshua F., Gregg, Marty

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ELECTRON MICROSCOPE WITH IMPROVED IMAGING RESOLUTION von Dona, Pleun, Henstra, Alexander

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REDUCTION OF THERMAL MAGNETIC FIELD NOISE IN TEM CORRECTOR SYSTEMS von Dona, Pleun, Henstra, Alexander

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Reduction of thermal magnetic field noise in TEM corrector systems von Dona, Pleun, Henstra, Alexander

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REDUCTION OF THERMAL MAGNETIC FIELD NOISE IN TEM CORRECTOR SYSTEMS von Dona, Pleun, Henstra, Alexander

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REDUCTION OF THERMAL MAGNETIC FIELD NOISE IN TEM CORRECTOR SYSTEMS von Dona, Pleun, Henstra, Alexander

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Axial alignment assembly, and charged particle microscope comprising such an alignment assembly von Smit, Casper Maria, Dona, Pleun

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Method of manufacturing a charged particle detector von Dona, Pleun, Janssen, Bart Jozef

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AXIAL ALIGNMENT ASSEMBLY, AND CHARGED PARTICLE MICROSCOPE COMPRISING SUCH AN ALIGNMENT ASSEMBLY von Smit, Casper Maria, Dona, Pleun

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AXIAL ALIGNMENT ASSEMBLY, AND CHARGED PARTICLE MICROSCOPE COMPRISING SUCH AN ALIGNMENT ASSEMBLY von Smit, Casper Maria, Dona, Pleun

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ELECTRON MICROSCOPE WITH IMPROVED IMAGING RESOLUTION von Dona, Pleun, Henstra, Alexander

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ELECTRON MICROSCOPE WITH IMPROVED IMAGING RESOLUTION von Dona, Pleun, Henstra, Alexander

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