The effect of anisotropy on the deformation and fracture of sapphire wafers subjected to thermal shocks von Vodenitcharova, T., Zhang, L.C., Zarudi, I., Yin, Y., Domyo, H., Ho, T., Sato, M.

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Extraction of SOS MOSFET RF equivalent circuit elements by LCR meter measurements von BERTLING, K, RAKIC, A. D, YEOW, Y. T, BRAWLEY, A, DOMYO, H, ROTELLA, F. M

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Monitoring the Electrical Properties of the Back Silicon Interface of Silicon-on-Sapphire Wafers von Domyo, H., Bertling, K., Tran Ho, Kistler, N., Imthurn, G., Stuber, M., Rakic, A.D., Yew-Tong Yeow

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The Effect of Thermal Shocks on the Stresses in a Sapphire Wafer von Vodenitcharova, T., Zhang, L.C., Zarudi, I., Yin, Y., Domyo, H., Ho, T.

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Characteristics of small-signal capacitances of silicon-on-sapphire MOSFETs von Kong, F.C.J., Yeow, Y.T., Domyo, H.

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Transient thermal analysis of sapphire wafers subjected to thermal shocks von Vodenitcharova, T., Zhang, L.C., Zarudi, I., Yin, Y., Domyo, H., Ho, T.

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Improvement in off-State Leakage Current of n-Channel SOS MOSFETs by Hydrogen Annealing of the SOS Film von Domyo, H., Imthurn, G., Tran Ho, Miscione, A. M., Rakic, A. D., Yew-Tong Yeow

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Comparison of SOS MOSFET's Equivalent Circuit Parameters Extracted From LCR Meter and VNA Measurement von Bertling, K., Rakic, A. D., Yew Tong Yeow, Brawley, A., Domyo, H., Rotella, F. M.

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SOS junctionless MOSFETs vs. inversion channel MOSFETs: Doubling the device speed without changing the technology von Bertling, K., Rakic, A.D., Yeow, Y. T., O'Brien, C. J., Domyo, H.

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Extraction of SOS MOSFET RF equivalent circuit elements by LCR meter measurements von Bertling, K, Rakic, A D, Yeow, Y T, Brawley, A, Domyo, H, Rotella, F M

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Comparison of the RF characteristics of inversion channel and depletion channel SOS MOSFETs von Bertling, K., Rakic, A. D., Yeow, Y. T., O'Brien, C. J., Domyo, H.

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Characteristics of small-signal capacitances of silicon-on-sapphire MOSFETs von Kong, F C J, Yeow, Y T, Domyo, H

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Extraction of RF equivalent circuit and semiconductor parameters of SOS MOSFETs from S-Parameter measurements von Boubals, A, Bertling, K, Domyo, H, Brawley, A, Rakic, A D, Yeow, Y T

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Origin of the low frequency type curve in Silicon-on-Sapphire MOS capacitors von Domyo, H., Bertling, K., Ho, T., Kistler, N., Imthurn, G., Stuber, M., Rakic, A.D., Yew-Tong Yeow

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SOI CMOS with high-performance passive components for analog, RF, and mixed signal design von Stuber, M., Megahed, M., Lee, J.J., Kobayashi, T., Domyo, H.

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A manufacturable SOI CMOS process for low power digital, analog, and RF applications von Stuber, M., Dennies, P., Lyons, G., Kobayashi, T., Domyo, H.

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