Graded microstructure and mechanical properties of additive manufactured Ti–6Al–4V via electron beam melting von Tan, Xipeng, Kok, Yihong, Tan, Yu Jun, Descoins, Marion, Mangelinck, Dominique, Tor, Shu Beng, Leong, Kah Fai, Chua, Chee Kai

Volltext

Reducing hot tearing by grain boundary segregation engineering in additive manufacturing: example of an AlxCoCrFeNi high-entropy alloy von Sun, Zhongji, Tan, Xipeng, Wang, Chengcheng, Descoins, Marion, Mangelinck, Dominique, Tor, Shu Beng, Jägle, Eric A., Zaefferer, Stefan, Raabe, Dierk

Volltext

Methods for Gibbs triple junction excess determination: Ti segregation in CoSi2 thin film von Zschiesche, Hannes, Charai, Ahmed, Alfonso, Claude, Mangelinck, Dominique

Volltext

Effect of Co, Pd and Pt ultra-thin films on the Ni-silicide formation: investigating the sandwich configuration von Quertite, Khalid, Gao, Jianbao, Descoins, Marion, Bertoglio, Maxime, Girardeaux, Christophe, Mangelinck, Dominique

Volltext

Nanometer-scale precipitations in a selective electron beam melted nickel-based superalloy von Chandra, Shubham, Tan, Xipeng, Narayan, R. Lakshmi, Descoins, Marion, Mangelinck, Dominique, Tor, Shu Beng, Liu, Erjia, Seet, Gerald

Volltext

Further Insight into Interfacial Interactions in Iron/Liquid Zn-Al System von Zapico-Álvarez, David, Barges, Patrick, Musik, Céline, Bertrand, Florence, Mataigne, Jean-Michel, Descoins, Marion, Mangelinck, Dominique, Giorgi, Marie-Laurence

Volltext

Si/Ge intermixing during Ge Stranski-Krastanov growth von Portavoce, Alain, Hoummada, Khalid, Ronda, Antoine, Mangelinck, Dominique, Berbezier, Isabelle

Volltext

Revealing hot tearing mechanism for an additively manufactured high-entropy alloy via selective laser melting von Sun, Z., Tan, X.P., Descoins, M., Mangelinck, D., Tor, S.B., Lim, C.S.

Volltext

High-resolution nanostructural investigation of Zn4Sb3 alloys von Gault, Baptiste, Marquis, Emmanuelle A., Saxey, David W., Hughes, Gareth M., Mangelinck, Dominique, Toberer, Eric S., Snyder, G. Jeff

Volltext

Mechanisms of Silicide Formation by Reactive Diffusion in Thin Films von Mangelinck, Dominique

Volltext

Effect of a Ti diffusion barrier on the cobalt silicide formation: solid solution, segregation and reactive diffusion von Zschiesche, Hannes, Alfonso, Claude, Charaï, Ahmed, Mangelinck, Dominique

Volltext

Revealing martensitic transformation and α/β interface evolution in electron beam melting three-dimensional-printed Ti-6Al-4V von Tan, Xipeng, Kok, Yihong, Toh, Wei Quan, Tan, Yu Jun, Descoins, Marion, Mangelinck, Dominique, Tor, Shu Beng, Leong, Kah Fai, Chua, Chee Kai

Volltext

C54-TiSi2 formation using nanosecond laser annealing of A-Si/Ti/A-Si stacks von Guelladress, Réda, Kerdilès, Sébastien, Dartois, Mélanie, Sabbione, Chiara, Gregoire, Magali, Mangelinck, Dominique

Volltext

Spatial arrangements and types of dislocations in interfacial networks obtained by Si(001) wafer bonding at low twist angle : a TEM characterization von Patout, Loïc, Alfonso, Claude, Descoins, Marion, Fournel, Frank, Mangelinck, Dominique, Mangelinck-Noël, Nathalie

Volltext

Reactive diffusion in the presence of a diffusion barrier: experiment and model von Mangelinck, Dominique, Luo, T, Girardeaux, Christophe

Volltext

Grain boundary in NbCo(Pt)Sn half-Heusler compounds: Segregation and solute drag on grain boundary migration von Luo, Ting, Mangelinck, Dominique, Serrano-Sánchez, Federico, Fu, Chenguang, Felser, Claudia, Gault, Baptiste

Volltext

On the influence of Ni(Pt)Si thin film formation on agglomeration threshold temperature and its impact on 3D imaging technology integration von Grégoire, M., Morris Anak, F., Verdier, S., Dabertrand, K., Guillemin, S., Mangelinck, D.

Volltext

Role of the slow diffusion species in the dewetting of compounds: The case of NiSi on a Si isotope multilayer studied by atom probe tomography von Luo, T., Girardeaux, C., Bracht, H., Mangelinck, D.

Volltext

C54-TiSi$_2$ formation using nanosecond laser annealing of A-Si/Ti/A-Si stacks von Guelladress, Réda, Kerdilès, Sébastien, Dartois, Mélanie, Sabbione, Chiara, Gregoire, Magali, Mangelinck, Dominique

Volltext

Methods for Gibbs triple junction excess determination: Ti segregation in [Formula omitted] thin film von Zschiesche, Hannes, Charai, Ahmed, Alfonso, Claude, Mangelinck, Dominique

Volltext