A conversation with William Q. Meeker von Doganaksoy, Necip

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A mixture model for determination of root cause frequency: Proposed solution to the open challenge von Doganaksoy, Necip

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A Career in Statistics: Beyond the Numbers von Gerald J. Hahn, Necip Doganaksoy

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Discussion of “Specifying prior distributions in reliability applications,” by Qinglong Tian, Colin Lewis‐Beck, Jarad B. Niemi, and William Meeker von Doganaksoy, Necip, Rigdon, Steven E.

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A career in statistics: beyond the numbers von Hahn, Gerald J, Doganaksoy, Necip

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Product reliability: How statistics fits in von Doganaksoy, Necip, Meeker, William Q, Hahn, Gerald J

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An Application of the Linear Errors-in-Variables Model in Semiconductor Device Performance Assessment von Doganaksoy, Necip, van Meer, Hans

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Topics for the Accounting Information Systems Course: A Dual Perspective Approach from Educators and Employers von Garnsey, Margaret, Doganaksoy, Necip, Phelan, Elaine

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A Conversation with Gerry Hahn von Doganaksoy, Necip

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Statistical intervals, not statistical significance von Hahn, Gerald J., Doganaksoy, Necip, Meeker, William Q.

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Reliability estimation following a field intervention von Doganaksoy, Necip

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Improving a Manufacturing Process Using Data-Based Methods von Doganaksoy, Necip, Hahn, Gerald J.

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A Career in Statistics von Hahn, Gerald J, Doganaksoy, Necip

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Getting the Right Data Up Front: A Key Challenge von Doganaksoy, Necip, Hahn, Gerald J.

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Comparisons of Approximate Confidence Intervals for Distributions Used in Life-Data Analysis von Doganaksoy, Necip, Schmee, Josef

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THE EVOLUTION OF SIX SIGMA von Hahn, Gerald J., Doganaksoy, Necip, Hoerl, Roger

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A Simplified Formulation of Likelihood Ratio Confidence Intervals Using a Novel Property von Doganaksoy, Necip

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Discussion: Statistics Research in Business and Industry - The General Electric Experience von Hahn, Gerald J., Hoerl, Roger, Doganaksoy, Necip, Gardner, Martha

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ASSESSMENT OF IMPACT OF MEASUREMENT VARIABILITY IN THE PRESENCE OF MULTIPLE SOURCES OF PRODUCT VARIABILITY von Doganaksoy, Necip

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The Future of Industrial Statistics: A Panel Discussion von Bisgaard, Søren, Doganaksoy, Necip, Fisher, Nicholas, Gunter, Bert, Hahn, Gerald, Keller-McNulty, Sallie, Kettenring, Jon, Meeker, William Q., Montgomery, Douglas C., Wu, C. F. Jeff

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