A conversation with William Q. Meeker von Doganaksoy, Necip

Volltext

A mixture model for determination of root cause frequency: Proposed solution to the open challenge von Doganaksoy, Necip

Volltext

Discussion of “Specifying prior distributions in reliability applications,” by Qinglong Tian, Colin Lewis‐Beck, Jarad B. Niemi, and William Meeker von Doganaksoy, Necip, Rigdon, Steven E.

Volltext

Product reliability: How statistics fits in von Doganaksoy, Necip, Meeker, William Q, Hahn, Gerald J

Volltext

An Application of the Linear Errors-in-Variables Model in Semiconductor Device Performance Assessment von Doganaksoy, Necip, van Meer, Hans

Volltext

Periodic template tests: A family of statistical randomness tests for a collection of binary sequences von Sulak, Fatih, Doğanaksoy, Ali, Uğuz, Muhiddin, Koçak, Onur

Volltext

Topics for the Accounting Information Systems Course: A Dual Perspective Approach from Educators and Employers von Garnsey, Margaret, Doganaksoy, Necip, Phelan, Elaine

Volltext

On the independence of statistical randomness tests included in the NIST test suite von SULAK, Fatih, UĞUZ, Muhiddin, KOÇAK, Onur, DOĞANAKSOY, Ali

Volltext

A Conversation with Gerry Hahn von Doganaksoy, Necip

Volltext

Statistical intervals, not statistical significance von Hahn, Gerald J., Doganaksoy, Necip, Meeker, William Q.

Volltext

A Career in Statistics: Beyond the Numbers von Gerald J. Hahn, Necip Doganaksoy

Volltext

Reliability estimation following a field intervention von Doganaksoy, Necip

Volltext bestellen

Counting Boolean functions with specified values in their Walsh spectrum von Uyan, Erdener, Çalık, Çağdaş, Doğanaksoy, Ali

Volltext

Mutual correlation of NIST statistical randomness tests and comparison of their sensitivities on transformed sequences von DOĞANAKSOY, Ali, SULAK, Fatih, UĞUZ, Muhiddin, ŞEKER, Okan, AKCENGİZ, Ziya

Volltext

Improving a Manufacturing Process Using Data-Based Methods von Doganaksoy, Necip, Hahn, Gerald J.

Volltext

R-2 composition tests: a family of statistical randomness tests for a collection of binary sequences von Uğuz, Muhiddin, Doğanaksoy, Ali, Sulak, Fatih, Koçak, Onur

Volltext

A Career in Statistics von Hahn, Gerald J, Doganaksoy, Necip

Volltext

A career in statistics: beyond the numbers von Hahn, Gerald J, Doganaksoy, Necip

Volltext

New Statistical Randomness Tests Based on Length of Runs von Şeker, Okan, Uğuz, Muhiddin, Sulak, Fatih, Doğanaksoy, Ali, Akcengiz, Ziya

Volltext

Getting the Right Data Up Front: A Key Challenge von Doganaksoy, Necip, Hahn, Gerald J.

Volltext