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  1. 1
    Generating test coverage bin based on simulation result

    Generating test coverage bin based on simulation result von EBBERS JONATHAN P, KAMPF FRANCIS A, POWERS BARBARA L, DITMYER BRUCE J, BUETI SUSAN FARMER, GRANATO SUZANNE, STERMOLE LOUIS

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  2. 2
    Generating test coverage bin based on simulation result

    Generating test coverage bin based on simulation result von Ditmyer, Bruce J, Bueti, Susan Farmer, Ebbers, Jonathan P, Granato, Suzanne, Kampf, Francis A, Powers, Barbara L, Stermole, Louis

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  3. 3
    GENERATING TEST COVERAGE BIN BASED ON SIMULATION RESULT

    GENERATING TEST COVERAGE BIN BASED ON SIMULATION RESULT von EBBERS JONATHAN P, KAMPF FRANCIS A, POWERS BARBARA L, DITMYER BRUCE J, BUETI SUSAN FARMER, GRANATO SUZANNE, STERMOLE LOUIS

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  4. 4
    Calculating AC chip performance using the LSSD scan path

    Calculating AC chip performance using the LSSD scan path von DICK, CARROLL J, STILL, GREGORY S, DITMYER, BRUCE J, JEREMIAH, THOMAS L, JONES, LAWRENCE

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