Study of resistive random access memory based on TiN/TaOx/TiN integrated into a 65 nm advanced complementary metal oxide semiconductor technology von DIOKH, Therese, LE-ROUX, Elise, CARABASSE, Catherine, CANDELIER, Philippe, DE SALVO, Barbara, JEANNOT, Simon, CAGLI, Carlo, JOUSSEAUME, Vincent, NODIN, Jean-François, GROS-JEAN, Mickaël, GAUMER, Clement, MELLIER, Maxime, CLUZEL, Jacques

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Study of resistive random access memory based on TiN/TaOx/TiN integrated into a 65nm advanced complementary metal oxide semiconductor technology von Diokh, Therese, Le-Roux, Elise, Jeannot, Simon, Cagli, Carlo, Jousseaume, Vincent, Nodin, Jean-François, Gros-Jean, Mickaël, Gaumer, Clement, Mellier, Maxime, Cluzel, Jacques, Carabasse, Catherine, Candelier, Philippe, De Salvo, Barbara

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PROCEDE ET DISPOSITIF DE COMMANDE D'UNE MEMOIRE RERAM von DIOKH THERESE ANDREE, CANDELIER PHILIPPE, DAMIENS JOEL, LEROUX ELISE

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RERAM MEMORY CONTROL METHOD AND DEVICE von DIOKH THÉRÈSE ANDRÉE, LE ROUX ELISE, CANDELIER PHILIPPE, DAMIENS JOEL

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