A Scalable SCR Compact Model for ESD Circuit Simulation von Di Sarro, J P, Rosenbaum, E

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Oscillatory Transmission Line Pulsing for Characterization of Device Transient Response von Di Sarro, J.P., Rosenbaum, E.

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ESD device with fast response and high transient current von Appaswamy, Aravind C, Di Sarro, James P

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ESD protection charge pump active clamp for low-leakage applications von Farbiz, Farzan, Di Sarro, James P

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ESD DEVICE WITH FAST RESPONSE AND HIGH TRANSIENT CURRENT von Appaswamy, Aravind C, Di Sarro, James P

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ESD device with fast response and high transient current von Appaswamy, Aravind C, Di Sarro, James P

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Conductivity modulated drain extended MOSFET von Appaswamy, Aravind C, Farbiz, Farzan, Di Sarro, James P

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ESD Protection Charge Pump Active Clamp for Low-Leakage Applications von Farbiz, Farzan, Di Sarro, James P

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ESD protection charge pump active clamp for low-leakage applications von Farbiz, Farzan, Di Sarro, James P

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ESD DEVICE WITH FAST RESPONSE AND HIGH TRANSIENT CURRENT von Appaswamy, Aravind C, Di Sarro, James P

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Conductivity Modulated Drain Extended MOSFET von Appaswamy, Aravind C, Farbiz, Farzan, Di Sarro, James P

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ESD PROTECTION CHARGE PUMP ACTIVE CLAMP FOR LOW-LEAKAGE APPLICATIONS von Farbiz Farzan, Di Sarro James P

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Conductivity modulated drain extended MOSFET von Appaswamy, Aravind C, Farbiz, Farzan, Di Sarro, James P

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Structure and method for dynamic biasing to improve ESD robustness of current mode logic (CML) drivers von Jack, Nathan D, Gauthier, Jr., Robert J, Mitra, Souvick, Di Sarro, James P, Li, JunJun

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Conductivity Modulated Drain Extended MOSFET von Appaswamy, Aravind C, Farbiz, Farzan, Di Sarro, James P

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Conductivity modulated drain extended MOSFET von Farbiz Farzan, Appaswamy Aravind C, Di Sarro James P

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Influence of Package Trace Properties on CDM Stress von Di Sarro, James P., Reynolds, Bill, Gauthier, Robert

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ESD NETWORK COMPRISING VARIABLE IMPEDANCE DISCHARGE PATH von Concannon, Ann Margaret, Rajagopal, Krishna Praveen Mysore, Di Sarro, James P, Dissegna, Mariano, Wang, Lihui

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Structure and method for dynamic biasing to improve ESD robustness of current mode logic (CML) drivers von Jack, Nathan D, Gauthier, Robert J, Mitra, Souvick, Di Sarro, James P, Li, JunJun

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IGBT coupled to a reverse bias device in series von Mysore Rajagopal, Krishna Praveen, Salman, Akram A, Ali, Muhammad Yusuf, Appaswamy, Aravind Chennimalai, Di Sarro, James P

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