The high-resolution diffraction beamline P08 at PETRA III von Seeck, O. H., Deiter, C., Pflaum, K., Bertam, F., Beerlink, A., Franz, H., Horbach, J., Schulte-Schrepping, H., Murphy, B. M., Greve, M., Magnussen, O.

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Study of a diamond channel cut monochromator for high repetition rate operation at the EuXFEL: FEA thermal load simulations and first experimental results von Tasca, K R, Petrov, I, Deiter, C, Martyushov, S, Polyakov, S, Rodriguez-Fernandez, A, Shayduk, R, Sinn, H, Terentyev, S, Vannoni, M, Zholudev, S, Samoylova, L

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Analysis of the Rate of Re-planning in Spot-Scanning Proton Therapy von Hu, Yue-Houng, Harper, Riley H., Deiter, Noelle C., Evans, Jaden D., Mahajan, Anita, Kruse, Jon J., Mundy, Daniel W.

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The Importance of Verification CT-QA Scans in Patients Treated with IMPT for Head and Neck Cancers von Evans, Jaden D, Harper, Riley H, Petersen, Molly, Harmsen, William S, Anand, Aman, Hunzeker, Ashley, Deiter, Noelle C, Schultz, Heather, Jethwa, Krishan R, Lester, Scott C, Routman, David M, Ma, Daniel J, Garces, Yolanda I, Neben-Wittich, Michelle A, Laack, Nadia N, Beltran, Chris J, Patel, Samir H, McGee, Lisa A, Rwigema, Jean-Claude M, Mundy, Daniel W, Foote, Robert L

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X-ray diffraction study on size effects in epitaxial magnetite thin films on MgO(0 0 1) von Bertram, F, Deiter, C, Hoefert, O, Schemme, T, Timmer, F, Suendorf, M, Zimmermann, B, Wollschläger, J

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Strain distribution in Si capping layers on SiGe islands: influence of cap thickness and footprint in reciprocal space von Hrauda, N, Zhang, J J, Süess, M J, Wintersberger, E, Holý, V, Stangl, J, Deiter, C, Seeck, O H, Bauer, G

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A compact high vacuum heating chamber for in-situ x-ray scattering studies von Bertram, F, Deiter, C, Pflaum, K, Seeck, O H

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Strain relief and shape oscillations in site-controlled coherent SiGe islands von Hrauda, N, Zhang, J J, Groiss, H, Etzelstorfer, T, Holý, V, Bauer, G, Deiter, C, Seeck, O H, Stangl, J

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Structural phase transition of ultra thin PrO2 films on Si(111) von Gevers, S, Weisemoeller, T, Zimmermann, B, Bertram, F, Deiter, C, Wollschläger, J

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Closely spaced SiGe barns as stressor structures for strain-enhancement in silicon von Hrauda, N., Zhang, J. J., Groiss, H., Gerharz, J. C., Etzelstorfer, T., Stangl, J., Holý, V., Deiter, C., Seeck, O. H., Bauer, G.

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Solid phase epitaxy of Ge films on CaF2/Si(1 1 1) von RUGERAMIGABO, E. P, DEITER, C, WOLLSCHLÄGER, J

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Structure and stability of cub-Pr2O3 films on Si(111) under post deposition annealing conditions von Gevers, S., Weisemoeller, T., Zimmermann, B., Deiter, C., Wollschläger, J.

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Ultrafast X-ray diffraction and scattering on the femtosecond X-ray experiment (FXE) instrument at the European XFEL: present status and future perspectives von Vinci, D., Jiang, Y., Schubert, R., Zalden, P., Khakhulin, D., Frankenberger, P., Alves Lima, F., Ardana-Lamas, F., Deiter, C., Biednov, M., Huang, X., Knoll, M., Jimenez, D.D., Otte, F., Paul Dutta, S., Wang, H., Yousef, H., Milne, C.

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Reordering between tetrahedral and octahedral sites in ultrathin magnetite films grown on MgO(001) von Bertram, F., Deiter, C., Schemme, T., Jentsch, S., Wollschläger, J.

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Au deposits on graphite: On the nature of high temperature desorption peaks in CO thermal desorption spectra von Nowitzki, T., Nickut, P., Deiter, C., Wollschläger, J., Al-Shamery, K., Bäumer, M.

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Homogeneous Si films on CaF2/Si(111) due to boron enhanced solid phase epitaxy von WOLLSCHLÄGER, J, DEITER, C, BIERKANDT, M, GERDES, A, BÄUMER, M, WANG, C. R, MÜLLER, B. H, HOFMANN, K. R

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In-situ x-ray diffraction studies on post-deposition vacuum-annealing of ultra-thin iron oxide films von Bertram, F., Deiter, C., Pflaum, K., Suendorf, M., Otte, C., Wollschläger, J.

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Megahertz-rate ultrafast X-ray scattering and holographic imaging at the European XFEL von Zhou Hagström, N, Schneider, M, Kerber, N, Yaroslavtsev, A, Burgos Parra, E, Beg, M, Lang, M, Günther, CM, Seng, B, Kammerbauer, F, Popescu, H, Pancaldi, M, Neeraj, K, Polley, D, Jangid, R, Hrkac, SB, Patel, SKK, Ovcharenko, S, Turenne, D, Ksenzov, D, Boeglin, C, Baidakova, M, Von Korff Schmising, C, Borchert, M, Vodungbo, B, Chen, K, Luo, C, Radu, F, Müller, L, Martínez Flórez, M, Philippi-Kobs, A, Riepp, M, Roseker, W, Grübel, G, Carley, R, Schlappa, J, Van Kuiken, BE, Gort, R, Mercadier, L, Agarwal, N, Le Guyader, L, Mercurio, G, Teichmann, M, Delitz, JT, Reich, A, Broers, C, Hickin, D, Deiter, C, Moore, J, Rompotis, D, Wang, J, Kane, D, Venkatesan, S, Meier, J, Pallas, F, Jezynski, T, Lederer, M, Boukhelef, D, Szuba, J, Wrona, K, Hauf, S, Zhu, J, Bergemann, M, Kamil, E, Kluyver, T, Rosca, R, Spirzewski, M, Kuster, M, Turcato, M, Lomidze, D, Samartsev, A, Engelke, J, Porro, M, Maffessanti, S, Hansen, K, Erdinger, F, Fischer, P, Fiorini, C, Castoldi, A, Manghisoni, M, Wunderer, CB, Fullerton, EE, Shpyrko, OG, Gutt, C, Sanchez-Hanke, C, Dürr, HA, Iacocca, E, Nembach, HT, Keller, MW, Shaw, JM, Silva, TJ, Kukreja, R, Fangohr, H, Eisebitt, S, Kläui, M, Jaouen, N, Scherz, A, Bonetti, S, Jal, E

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Surfactant enhanced solid phase epitaxy of Ge/CaF 2 /Si(111): Synchrotron x-ray characterization of structure and morphology von Wollschläger, J., Deiter, C., Wang, C. R., Müller, B. H., Hofmann, K. R.

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Surfactant enhanced solid phase epitaxy of Ge/CaF{sub 2}/Si(111): Synchrotron x-ray characterization of structure and morphology von Wollschlaeger, J., Deiter, C., Wang, C. R., Mueller, B. H., Hofmann, K. R.

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