Structural and electrical characterization of heteroepitaxial lead zirconate titanate thin films von de Keijser, M., Cillessen, J. F. M., Janssen, R. B. F., De Veirman, A. E. M., de Leeuw, D. M.

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Inverted spin valves for magnetic heads and sensors von Lenssen, K.-M. H., De Veirman, A. E. M., Donkers, J. J. T. M.

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‘3-Dimensional’ TEM silicon-device analysis by combining plan-view and FIB sample preparation von De Veirman, A.E.M.

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Transmission electron microscopy study of unhydrided, dehydrided and annealed LaNi5 von De Veirman, A. E. M., Staals, A. A., Notten, P. H. L.

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Columnar microstructures in magnetron-sputtered refractory metal thin films of tungsten, molybdenum and W-Ti-(N) von Dirks, A.G., Wolters, R.A.M., De Veirman, A.E.M.

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The structure of heteroepitaxial lead titanate layers grown by organometallic chemical vapour deposition von de Keijser, M., de Leeuw, D.M., van Veldhoven, P.J., De Veirman, A.E.M., Neerinck, D.G., Dormans, G.J.M.

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On the ferromagnetic interlayer coupling in exchange-biased spin-valve multilayers von Kools, J.C.S., Rijks, T.G.S.M., De Veirman, A.E.M., Coehoorn, R.

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AlSiV and AlSiVPd films as alternatives for AlSiCu interconnect: microstructure and its impact on reliability von Dirks, A.G., Augur, R.A., De Veirman, A.E.M.

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Transmission electron microscopy study of PbTiO3 and PbZrxTi1−xO3 films von De Veirman, A. E. M., Staals, A. A., Klee, M., Larsen, P. K.

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Quasicrystalline (Al,Pd)-phase in dilute AlSiVPd films for use as reliable metallizations in ultralarge scale integration von Dirks, A.G., De Veirman, A.E.M.

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Hetero-epitaxial oxidic conductor La1-xSrxCoO3 prepared by pulsed laser deposition von CILLESSEN, J. F. M, WOLF, R. M, DE VEIRMAN, A. E. M

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Transmission electron microscopy study of PbTiO 3 and PbZr x Ti 1−x O 3 films von De Veirman, A. E. M., Staals, A. A., Klee, M., Larsen, P. K.

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Grain size and strain in thin sputter-deposited Ni0.8Fe0.2 and Cu films von NEERINCK, D. G, DE VEIRMAN, A. E. M, SLANGEN, M. H. J, RIJKS, T. G. S. M, KOOLS, J. C. S

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Influence of grain size on the transport properties of Ni(80 )Fe(20) and Cu thin films von Rijks, TGSM, Sour, R L H, Neerinck, D G, De Veirman, A E M, Coehoorn, R, Kools, J C S, Gillies, M F, de Jonge, W J M

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A new diamond-related compound in the system Al2O3-Al4C3-AlN von GROEN, W. A, KRAAN, M. J, VAN HAL, P. F, DE VEIRMAN, A. E. M

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Cross-sectional transmission electron microscopy studies of metallic multilayers von De Veirman, A.E.M., Hakkens, F.J.G., Dirks, A.G.

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Transmission electron microscopy study of unhydrided, dehydrided and annealed LaNi\+v\5\-v von Veirman, A. E. M. de, Staals |h A. A., Notten |h P. H. L.

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Transmission electron microsocopy study of unhydrided, dehydrided and annealed LaNi sub 5 von De Veirman, A E M, Staals, A A, Notten, P H L

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Transmission electron microscopy study of unhydrided, dehydrided and annealed LaNi 5 von De Veirman, A. E. M., Staals, A. A., Notten, P. H. L.

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In situ X-ray diffraction : a usefull tool to investigate hydride formation reactions von NOTTEN, P. H. L, DAAMS, J. L. C, DE VEIRMAN, A. E. M, STAALS, A. A

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