Investigation of deep levels in n-type 4H-SiC epilayers irradiated with low-energy electrons von Danno, Katsunori, Kimoto, Tsunenobu

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Lifetime-killing defects in 4H-SiC epilayers and lifetime control by low-energy electron irradiation von Kimoto, Tsunenobu, Danno, Katsunori, Suda, Jun

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Deep level transient spectroscopy on as-grown and electron-irradiated p -type 4H-SiC epilayers von Danno, Katsunori, Kimoto, Tsunenobu

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Investigation of carrier lifetime in 4H-SiC epilayers and lifetime control by electron irradiation von Danno, Katsunori, Nakamura, Daisuke, Kimoto, Tsunenobu

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Materials informatics approach to understand aluminum alloys von Tamura, Ryo, Watanabe, Makoto, Mamiya, Hiroaki, Washio, Kota, Yano, Masao, Danno, Katsunori, Kato, Akira, Shoji, Tetsuya

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Trials of Solution Growth of Dislocation-Free 4H-SiC Bulk Crystals von Kimoto, Hiroyuki, Yamaguchi, Satoshi, Danno, Katsunori, Bessho, Takeshi, Sato, Kazuaki

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Impacts of growth parameters on deep levels in n-type 4H-SiC von Danno, Katsunori, Hori, Tsutomu, Kimoto, Tsunenobu

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Solubility and diffusion of chromium in 4H-SiC von Danno, Katsunori, Saito, Makoto, Seki, Akinori, Sato, Kazuaki, Bessho, Takeshi, Kimoto, Tsunenobu

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Correlation between etch pits formed by molten KOH+Na2O2 etching and dislocation types in heavily doped n+-4H–SiC studied by X-ray topography von Yao, Yongzhao, Ishikawa, Yukari, Sugawara, Yoshihiro, Sato, Koji, Danno, Katsunori, Suzuki, Hiroshi, Bessho, Takeshi, Yamaguchi, Satoshi, Nishikawa, Koichi

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Transmission Electron Microscopy Analysis of a Threading Dislocation with $c+a$ Burgers Vector in 4H-SiC von Sugawara, Yoshihiro, Nakamori, Michio, Yao, Yong-Zhao, Ishikawa, Yukari, Danno, Katsunori, Suzuki, Hiroshi, Bessho, Takeshi, Yamaguchi, Satoshi, Nishikawa, Koichi, Ikuhara, Yuichi

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Dislocation Revelation from ($000\bar{1}$) Carbon-face of 4H-SiC by Using Vaporized KOH at High Temperature von Yao, Yong-Zhao, Ishikawa, Yukari, Sato, Koji, Sugawara, Yoshihiro, Danno, Katsunori, Suzuki, Hiroshi, Bessho, Takeshi

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High-Speed Growth of High-Quality 4H-SiC Bulk by Solution Growth Using Si-Cr Based Melt von Saitoh, Hiroaki, Daikoku, H., Fujiwara, Y., Danno, Katsunori, Sakamoto, H., Kawai, Yoichiro, Seki, Akinori, Ishii, T.

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Diffusion of Transition Metals in 4H-SiC and Trials of Impurity Gettering von Danno, Katsunori, Saitoh, Hiroaki, Seki, Akinori, Shirai, Takayuki, Suzuki, Hiroshi, Bessho, Takeshi, Kawai, Yoichiro, Kimoto, Tsunenobu

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Influence of Al2O3 atomic-layer deposition temperature on positive-bias instability of metal/Al2O3/β-Ga2O3 capacitors von Hiraiwa, Atsushi, Horikawa, Kiyotaka, Kawarada, Hiroshi, Kado, Motohisa, Danno, Katsunori

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Characterization of Threading Edge Dislocation in 4H-SiC by X-Ray Topography and Transmission Electron Microscopy von Suzuki, Hiroshi, Sugawara, Yoshihiro, Nishikawa, Koichi, Bessho, Takeshi, Ishikawa, Yukari, Danno, Katsunori, Ikuhara, Yuichi, Yao, Yong Zhao, Yamaguchi, Satoshi

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Postdeposition annealing effect on atomic-layer-deposited Al2O3 gate insulator on (001) β-Ga2O3 von Hiraiwa, Atsushi, Horikawa, Kiyotaka, Kawarada, Hiroshi, Kado, Motohisa, Danno, Katsunori

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Dislocation Revelation for 4H-SiC by Using Vaporized NaOH: A Possible Way to Distinguish Edge, Screw and Mixed Threading Dislocations by Etch Pit Method von Sato, Koji, Suzuki, Hiroshi, Sugawara, Yoshihiro, Sakamoto, Hidemitsu, Nishikawa, Koichi, Bessho, Takeshi, Ishikawa, Yukari, Danno, Katsunori, Yao, Yong Zhao, Yamaguchi, Satoshi

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Deep Levels in Electron-Irradiated n- and p-type 4H-SiC Investigated by Deep Level Transient Spectroscopy von Danno, Katsunori, Kimoto, Tsunenobu

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Cross-sectional observation of stacking faults in 4H-SiC by KOH etching on nonpolar $\{ 1\bar{1}00\} $ face, cathodoluminescence imaging, and transmission electron microscopy von Yao, Yongzhao, Ishikawa, Yukari, Sugawara, Yoshihiro, Sato, Koji, Shirai, Takayuki, Danno, Katsunori, Suzuki, Hiroshi, Sakamoto, Hidemitsu, Bessho, Takeshi, Dierre, Benjamin, Watanabe, Kentaro, Sekiguchi, Takashi

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Variation of Etch Pit Size by Screw Dislocation Tilt in 4H-SiC Wafer von Suzuki, Hiroshi, Sugawara, Yoshihiro, Ishikawa, Yukari, Danno, Katsunori, Yao, Yong Zhao, Kawai, Yoichiro, Shibata, Noriyoshi

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