Electronic structure of graphite fluorides von Kurmaev, E.Z, Moewes, A, Ederer, D.L, Ishii, H, Seki, K, Yanagihara, M, Okino, F, Touhara, H

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Electronic structures of the tungsten borides WB, W2B and W2B5 von Stadler, S., Winarski, R.P., MacLaren, J.M., Ederer, D.L., vanEk, J., Moewes, A., Grush, M.M., Callcott, T.A., Perera, R.C.C.

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Characterization of CNx films by X-ray emission measurements von Kurmaev, E.Z, Moewes, A, Winarski, R.P, Shamin, S.N, Ederer, D.L, Feng, J.Y, Turner, S.S

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Crystal-momentum-resolved electronic structure of solids using resonant soft-X-ray fluorescence spectroscopy von Carlisle, J.A., Blankenship, S.R., Terminello, L.J., Jia, J.J., Callcott, T.A., Ederer, D.L., Perera, R.C.C., Himpsel, F.J.

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Modeling final-state interaction effects in inelastic X-ray scattering from solids: resonant and non-resonant von Shirley, Eric L., Soininen, J.A., Zhang, G.P., Carlisle, J.A., Callcott, T.A., Ederer, D.L., Terminello, L.J., Perera, R.C.C.

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Resonant inelastic scattering at the L edge of Ti in Barium Strontium Titanate by soft X-ray fluorescence spectroscopy von Uehara, Y., Lindle, D.W., Callcott, T.A., Terminello, L.T., Himpsel, F.J., Ederer, D.L., Underwood, J.H., Gullikson, E.M., Perera, R.C.C.

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Soft X-ray emission spectroscopy of early transition metal compounds von Shin, S., Fujisawa, M., Ishii, H., Harada, Y., Watanabe, M., Grush, M.M., Callcott, T.A., Perera, R.C.C., Kurmaev, E.Z., Moewes, A., Winarski, R., Stadler, S., Ederer, D.L.

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X-ray emission spectra and electronic structure of CuIr2S4 and CuIr2Se4 von Kurmaev, E.Z, Galakhov, V.R, Zatsepin, D.A, Trofimova, V.A, Stadler, S, Ederer, D.L, Moewes, A, Grush, M.M, Callcott, T.A, Matsuno, J, Fujimori, A, Nagata, S

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Radiation-induced degradation of polyethersulphone films studied by fluorescent X-ray emission spectroscopy von Kurmaev, E.Z., Winarski, R.P., Endo, K., Ida, T., Moewes, A., Ederer, D.L., Pivin, J.-C., Shamin, S.N., Trofimova, V.A., Yarmoshenko, Yu.M.

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Local and electronic structure of carbon and nitrogen atoms in oxycarbonitrate superconductors von Kurmaev, E.Z, Moewes, A, Zhigadlo, N.D, Takayama-Muromachi, E, Yarmoshenko, Y.M, Shamin, S.N, Nekrasov, I.A, Bureev, O.A, Ederer, D.L

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Soft X-ray emission and absorption—a comparative study on the sensitivity to oxidation state and ligand environment of transition metal complexes von Grush, M.M, Muramatsu, Y, Underwood, J.H, Gullikson, E.M, Ederer, D.L, Perera, R.C.C, Callcott, T.A

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Soft X-ray fluorescence measurements of irradiated polymer films von Winarski, R.P., Ederer, D.L., Pivin, J.-C., Kurmaev, E.Z., Shamin, S.N., Moewes, A., Chang, G.S., Whang, C.N., Endo, K., Ida, T.

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First experimental results from IBM/TENN/TULANE/LLNL/LBL undulator beamline at the advanced light source von Jia, J. J., Callcott, T. A., Yurkas, J., Ellis, A. W., Himpsel, F. J., Samant, M. G., Stöhr, J., Ederer, D. L., Carlisle, J. A., Hudson, E. A., Terminello, L. J., Shuh, D. K., Perera, R. C. C.

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X-ray Raman scattering at the edge of manganese compounds: Characteristic behaviour of and von Jiménez-Mier, José, Ederer, D.L., Schuler, T.

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Soft X-ray fluorescence measurements of irradiated polyimide and polycarbosilane films von Kurmaev, E.Z, Winarski, R.P, Ederer, D.L, Pivin, J.-C, Shamin, S.N, Moewes, A, Callcott, T.A, Chang, G.S, Whang, C.N

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X-ray Raman scattering at the L edge of manganese compounds: Characteristic behaviour of Mn 2 + and Mn 3 von Jiménez-Mier, José, Ederer, D.L., Schuler, T.

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Electronic structure of niobium oxides von Kurmaev, E.Z, Moewes, A, Bureev, O.G, Nekrasov, I.A, Cherkashenko, V.M, Korotin, M.A, Ederer, D.L

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Probing the graphite band structure with resonant soft-x-ray fluorescence von Carlisle, JA, Shirley, EL, Hudson, EA, Terminello, LJ, Callcott, TA, Jia, JJ, Ederer, DL, Perera, RC, Himpsel, FJ

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Band-structure and core-hole effects in resonant inelastic soft-x-ray scattering: Experiment and theory von Carlisle, J. A., Shirley, Eric L., Terminello, L. J., Jia, J. J., Callcott, T. A., Ederer, D. L., Perera, R. C. C., Himpsel, F. J.

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Photo-oxidation of electroluminescent polymers studied by core-level photoabsorption spectroscopy von Sutherland, D. G. J., Carlisle, J. A., Elliker, P., Fox, G., Hagler, T. W., Jimenez, I., Lee, H. W., Pakbaz, K., Terminello, L. J., Williams, S. C., Himpsel, F. J., Shuh, D. K., Tong, W. M., Jia, J. J., Callcott, T. A., Ederer, D. L.

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