Don't forget to lock your SIB: hiding instruments using P1687 von Dworak, Jennifer, Crouch, Al, Potter, John, Zygmontowicz, Adam, Thornton, Micah

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Generalizing Access to Instrumentation Embedded in a Semiconductor Device von Crouch, Al, Laisne, Michael, Keim, Martin

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Optimization trade-offs for vector volume and test power von Pouya, B., Crouch, A.L.

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IEEE P1687 IJTAG a presentation of current technology von Posse, K., Crouch, A., Rearick, J.

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IJTAG (internal JTAG): a step toward a DFT standard von Rearick, J., Eklow, B., Posse, K., Crouch, A., Bennetts, B.

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IEEE P1687: Toward Standardized Access of Embedded Instrumentation von Posse, Ken, Crouch, Al, Rearick, Jeff, Eklow, Bill, Laisne, Mike, Bennetts, Ben, Doege, Jason, Ricchetti, Mike, Cote, J-f

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Future trends in test: the adoption and use of low cost structural testers von Crouch, A.L.

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We need more standards like IEEE 1500 von Abramovici, Miron, Crouch, Al

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A Production IR-Drop Screen on a Chip von Abuhamdeh, Z., Hannagan, B., Crouch, A.L., Remmers, J.

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Testability features of the MC68060 microprocessor von Crouch, A.L., Pressly, M., Circello, J.

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Primary care in the A&E department: meeting the challenge: a workshop series for A&E nurses von Crouch, R. et al

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AC scan path selection for physical debugging von Crouch, A.L., Potter, J.C., Doege, A.

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The superscalar architecture of the MC68060 von Circello, J., Edgington, G., McCarthy, D., Gay, J., Schimke, D., Sullivan, S., Duerden, R., Hinds, C., Marquette, D., Sood, L., Couch, A., Chow, D.

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An analysis of telephone calls to an inner-city accident and emergency department von CROUCH, R, PATEL, A, WILLIAMS, S, DALE, J

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Low power mode and IEEE 1149.1 compliance: a low power solution von Crouch, A.L., Ramus, R., Maunder, C.

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Very low cost testers: Opportunities and challenges von Bedsole, J., Raina, R., Crouch, A., Abadir, M.S.

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Designing and verifying embedded microprocessors von Crouch, A., Freeman, J.

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Test development for a third-version ColdFire microprocessor von Crouch, A.L., Mateja, M., McLaurin, T.L., Potter, J.C., Tran, D.

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Test development for second-generation ColdFire microprocessors von Amason, D., Crouch, A.L., Eisele, R., Giles, G., Mateja, M.

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Paediatric calls to an inner city accident and emergency department: service demand and advice given von Crouch, R, Patel, A, Dale, J

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