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  1. 1
    Picosecond backside optical detection of internal signals in flip-chip mounted silicon VLSI circuits

    Picosecond backside optical detection of internal signals in flip-chip mounted silicon VLSI circuits von Heinrich, H.K., Pakdaman, N., Prince, J.L., Kent, D.S., Cropp, L.M.

    Veröffentlicht in Microelectronic engineering

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  2. 2
    Backside optical measurements of picosecond internal gate delays in a flip-chip packaged silicon VLSI circuit

    Backside optical measurements of picosecond internal gate delays in a flip-chip packaged silicon VLSI circuit von Heinrich, H.K., Pakdaman, N., Kent, D.S., Cropp, L.M.


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