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  1. 1
    Nanoscale Patterning of Alkyl Monolayers on Silicon Using the Atomic Force Microscope

    Nanoscale Patterning of Alkyl Monolayers on Silicon Using the Atomic Force Microscope von Headrick, Jill E, Armstrong, Matt, Cratty, Justin, Hammond, Stephanie, Sheriff, Bonnie A, Berrie, Cindy L

    Veröffentlicht in Langmuir

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  2. 2
    AFM and STM characterization of thiol and thiophene functionalized SWNTs: pitfalls in the use of chemical markers to determine the extent of sidewall functionalization in SWNTs

    AFM and STM characterization of thiol and thiophene functionalized SWNTs: pitfalls in the use of chemical markers to determine the extent of sidewall functionalization in SWNTs von Zhang, Lei, Zhang, Jun, Schmandt, Nicolaus, Cratty, Justin, Khabashesku, Valery N, Kelly, Kevin F, Barron, Andrew R


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