Heavy ion and proton induced single event transients in comparators von Nichols, D.K., Coss, J.R., Miyahira, T.F., Schwartz, H.R.

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An observation of proton-induced latchup (in CMOS microprocessor) von Nichols, D.K., Coss, J.R., Watson, R.K., Schwartz, H.R., Pease, R.L.

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Full temperature single event upset characterization of two microprocessor technologies von Nichols, D.K., Coss, J.R., Smith, L.S., Rax, B., Huebner, M., Watson, K.

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Dual sensor gamma ray calorimeter von HEMMIG PHILIP B, COTE MAURICE J, COSS JAMES R

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Heavy ion induced Single Event Phenomena (SEP) data for semiconductor devices from engineering testing von Nichols, Donald K., Huebner, Mark A., Price, William E., Smith, L. S., Coss, James R.

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TRANSIENT RADIATION VULNERABILITY OF MONOLITHIC BINARY CIRCUITS von CHANG,William W, Steele,Edward J, Raymond,James P, Lawrence,Elliott G, Coss,James R

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Total-dose radiation effects data for semiconductor devices (1989 supplement) von Martin, Keith E., Coss, James R., Goben, Charles A., Shaw, David C., Farmanesh, Sam, Davarpanah, Michael M., Craft, Leroy H., Price, William E.

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Models of second-order effects in metal-oxide-semiconductor field-effect transistors for computer applications von Benumof, Reuben, Zoutendyk, John, Coss, James

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Juvenile rheumatoid arthritis; a study of fifty-six cases with a note on skeletal changes von COSS, Jr, J A, BOOTS, R H

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Changes in the bacterial flora of the throat and intestinal tract during prolonged oral administration of penicillin von Lipman, Miriam Olmstead, Coss, James A., Boots, Ralph H.

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Prolonged administration of penicillin in arthritis von Coss, James A., Bauman, Eli, Boots, Ralph H., Lipman, Miriam Olmstead

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