Systemic gene dysregulation in classical Galactosaemia: Is there a central mechanism? von Coss, K.P., Treacy, E.P., Cotter, E.J., Knerr, I., Murray, D.W., Shin, Y.S., Doran, P.P.

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IgG N-glycans as potential biomarkers for determining galactose tolerance in Classical Galactosaemia von Coss, K.P., Byrne, J.C., Coman, D.J., Adamczyk, B., Abrahams, J.L., Saldova, R., Brown, A.Y., Walsh, O., Hendroff, U., Carolan, C., Rudd, P.M., Treacy, E.P.

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Single event gate rupture in commercial power MOSFETs von Nichols, D.K., Coss, J.R., McCarty, K.P.

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Single event effects testing of the Crystal CS5327 16-bit ADC von McCarty, K.P., Coss, J.R., Nichols, D.K., Swift, G.M., LaBel, K.A.

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TRENDS IN DEVICE SEE SUSCEPTIBILITY FROM HEAVY IONS von Nichols, D.K., Coss, J.R., McCarty, K.P., Schwartz, H.R., Swift, G.M., Watson, R.K., Koga, R.

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Observations of single event failure in power MOSFETs von Nichols, D.K., McCarty, K.P., Coss, J.R., Waskiewicz, A., Groninger, J., Oberg, D., Wert, J., Majewski, P., Koga, R.

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Overview Of Device See Susceptibility From Heavy Ions von Nichols, D.K., Coss, J.R., McCarty, K.P., Schwartz, H.R., Smith, L.S., Swift, G.M., Watson, R.K., Koga, R., Crain, W.R., Crawford, K.B., Hansel, S.J.

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