Disruption of bakers’ yeast using a disrupter of simple and novel geometry von Lovitt, R.W, Jones, M, Collins, S.E, Coss, G.M, Yau, C.P, Attouch, C

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Device SEE susceptibility update: 1996-1998 von Coss, J.R., Miyahira, T.F., Selva, L.E., Swift, G.M.

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Single event effects testing of the Crystal CS5327 16-bit ADC von McCarty, K.P., Coss, J.R., Nichols, D.K., Swift, G.M., LaBel, K.A.

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Compendium of single event failures in power MOSFETs von Coss, J.R., Swift, G.M., Selva, L.E., Titus, J.L., Normand, E., Oberg, D.L., Wert, J.L.

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TRENDS IN DEVICE SEE SUSCEPTIBILITY FROM HEAVY IONS von Nichols, D.K., Coss, J.R., McCarty, K.P., Schwartz, H.R., Swift, G.M., Watson, R.K., Koga, R.

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Device SEE susceptibility from heavy ions (1995-1996) von Nichols, D.K., Coss, J.R., Miyahira, T.F., Schwartz, H.R., Swift, G.M., Koga, R., Crain, W.R., Crawford, K.B., Penzin, S.H.

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Overview Of Device See Susceptibility From Heavy Ions von Nichols, D.K., Coss, J.R., McCarty, K.P., Schwartz, H.R., Smith, L.S., Swift, G.M., Watson, R.K., Koga, R., Crain, W.R., Crawford, K.B., Hansel, S.J.

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