High resolution photoemission study of C 60 on Si(111) as a precursor of SiC growth von Pesci, A., Ferrari, L., Comicioli, C., Pedio, M., Cepek, C., Schiavuta, P., Pivetta, M., Sancrotti, M.

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Sb-terminated Si(110), Si(100) and Si(111) surfaces studied with high resolution core-level spectroscopy von Cricenti, A, Ottaviani, C, Comicioli, C, Crotti, C, Ferrari, L, Quaresima, C, Perfetti, P, Le Lay, G

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Photoemission from atomic and molecular adsorbates on Rh(100) von Zacchigna, M., Astaldi, C., Prince, K.C., Sastry, M., Comicioli, C., Rosei, R., Quaresima, C., Ottaviani, C., Crotti, C., Antonini, A., Matteucci, M., Perfetti, P.

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NEXAFS multiple scattering calculations of KO2 von Pedio, M., Wu, Z. Y., Benfatto, M., Mascaraque, A., Michel, E., Crotti, C., Peloi, M., Comicioli, C.

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Core-level photoemission from graphite von Prince, K. C., Ulrych, I., Peloi, M., Ressel, B., Cháb, V., Crotti, C., Comicioli, C.

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Structure of Rh&[;110&];(1x2) and Rh&[;110&]; (2x2)p2mg-O surfaces von Comicioli, C., Dhanak, V.R., Comelli, G., Astaldi, C., Prince, K.C., Rosei, R., Atrei, A., Zanazzi, E.

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Surface core level shift photoelectron diffraction of Rh(100) von Prince, K.C., Ressel, B., Astaldi, C., Peloi, M., Rosei, R., Polcik, M., Crotti, C., Zacchigna, M., Comicioli, C., Ottaviani, C., Quaresima, C., Perfetti, P.

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Chemisorption of azafullerene on silicon : isolating C59N monomers von BUTCHER, M. J, JONES, F. H, CROTTI, C, COTIER, B. N, TAYLOR, M. D. R, MORIARTY, P, BETON, P. H, PRASSIDES, K, TAGMATARCHIS, N, COMICIOLI, C, OTTAVIANI, C

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Mechanical design aspects of a soft X-ray plane grating monochromator von Vašina, Radovan, Kolařı́k, Vladimı́r, Doležel, Pavel, Mynář, Martin, Vondráček, Martin, Cháb, Vladimı́r, Slezák, Jiřı́, Comicioli, Cesare, Prince, Kevin C.

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High resolution photoemission study of the surfactant desorption after Sb mediated Ge epitaxy on Si(001) von De Padova, P., Larciprete, R., Quaresima, C., Ottaviani, C., Comicioli, C., Crotti, C., Håkansson, M.C., Peloi, M., Ressel, B., Perfetti, P.

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Synchrotron radiation photoelectron spectroscopy of the O(2s) core level as a tool for monitoring the reducing effects of ion bombardment on SnO2 thin films von De Padova, P., Larciprete, R., Ottaviani, C., Quaresima, C., Perfetti, P., Borsella, E., Astaldi, C., Comicioli, C., Crotti, C., Matteucci, M., Zacchigna, M., Prince, K.

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On the electronic properties of the quasi-one-dimensional crystal Nb4Te17I4 von BERGER, H, MARSI, M, MARGARITONDO, G, FORRO, L, BEELI, C, CROTTI, C, ZACCHIGNA, M, COMICIOLI, C, ASTALDI, C, PRINCE, K

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Observation of and inner-shell doubly excited states von Avaldi, L, Camilloni, R, Stefani, G, Comicioli, C, Zacchigna, M, Prince, K C, Zitnik, M, Quaresima, C, Ottaviani, C, Crotti, C, Perfetti, P

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Surface core level shifts in III–V semiconductors: a high resolution photoemission study von Ottaviani, C., Capozi, M., Quaresima, C., Matteucci, M., Crotti, C., Perfetti, P., Astaldi, C., Zacchigna, M., Comicioli, C., Evans, M., Prince, K.C.

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High resolution photoemission study of C60 on Si(111) as a precursor of SiC growth von Pesci, A., Ferrari, L., Comicioli, C., Pedio, M., Cepek, C., Schiavuta, P., Pivetta, M., Sancrotti, M.

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Surface-induced broadening of photoemission core levels von Zacchigna, M, Astaldi, C, Prince, KC, Sastry, M, Comicioli, C, Evans, M, Rosei, R, Quaresima, C, Ottaviani, C, Crotti, C, Matteucci, M, Perfetti, P

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NEXAFS multiple scattering calculations of KO 2 von Pedio, M., Wu, Z. Y., Benfatto, M., Mascaraque, A., Michel, E., Crotti, C., Peloi, M., Comicioli, C.

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C 59 N Monomers: Stabilization through Immobilization von Butcher, M. J., Jones, F. H., Beton, P. H., Moriarty, P., Cotier, B. N., Upward, M. D., Prassides, K., Kordatos, K., Tagmatarchis, N., Wudl, F., Dhanak, V., Johal, T. K., Crotti, C., Comicioli, C., Ottaviani, C.

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Chemisorption of azafullerene on silicon: isolating C 59N monomers von Butcher, M.J., Jones, F.H., Cotier, B.N., Taylor, M.D.R., Moriarty, P., Beton, P.H., Prassides, K., Tagmatarchis, N., Comicioli, C., Ottaviani, C., Crotti, C.

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Synchrotron radiation photoelectron spectroscopy of the O(2s) core level as a tool for monitoring the reducing effects of ion bombardment on SnO 2 thin films von De Padova, P., Larciprete, R., Ottaviani, C., Quaresima, C., Perfetti, P., Borsella, E., Astaldi, C., Comicioli, C., Crotti, C., Matteucci, M., Zacchigna, M., Prince, K.

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